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Seme LAB BUL DataSheet

No. Partie # Fabricant Description Fiche Technique
1
BUL54AFI

Seme LAB
NPN Transistor

• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high accuracy masking for tight control of characteristics from batch to
Datasheet
2
BUL53A

Seme LAB
NPN Transistor
2.54 2.54 TO220 Pin 1
  – Base Pin 2
  – Collector Pin 3
  – Emitter
• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high acc
Datasheet
3
BUL55B

Seme LAB
NPN Transistor
2.54 2.54 TO220 Pin 1
  – Base Pin 2
  – Collector Pin 3
  – Emitter
• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high acc
Datasheet
4
BUL49A

Seme LAB
NPN Transistor

• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high accuracy masking for tight control of characteristics from batch to
Datasheet
5
BUL54

Seme LAB
NPN Transistor
TO220
• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high accuracy masking for tight control of characteristics from bat
Datasheet
6
BUL54A

Seme LAB
NPN Transistor
TO220
• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high accuracy masking for tight control of characteristics from bat
Datasheet
7
BUL55A

Seme LAB
NPN Transistor
2.54 2.54 TO220 Pin 1
  – Base Pin 2
  – Collector Pin 3
  – Emitter
• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high acc
Datasheet
8
BUL52B

Seme LAB
NPN Transistor
TO220
• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high accuracy masking for tight control of characteristics from bat
Datasheet
9
BUL53BSMD

Seme LAB
NPN Transistor

• Multi-Base design for efficient energy distribution across the chip.
• SIgnificantly improved switching and energy ratings across full temperature range.
• Ion implant and high accuracy masking for tight control of characteristics from batch to bat
Datasheet
10
BUL54B

Seme LAB
NPN Transistor

• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high accuracy masking for tight control of characteristics from batch to
Datasheet
11
BUL54BFI

Seme LAB
NPN Transistor

• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high accuracy masking for tight control of characteristics from batch to
Datasheet
12
BUL56A

Seme LAB
NPN Transistor
2.54 2.54 TO220 Pin 1
  – Base Pin 2
  – Collector Pin 3
  – Emitter
• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high acc
Datasheet
13
BUL58

Seme LAB
NPN Transistor
9 .6 9 .3 1 1 .5 1 1 .2 7 (0 8 (0 8 (0 8 (0 .3 8 .3 6 .4 5 .4 4 1 ) 9 ) 6 ) 4 ) 0 .5 0 (0 .0 2 0 ) 0 .2 6 (0 .0 1 0 )
• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings a
Datasheet
14
BUL50A

Seme LAB
NPN Transistor
21.0 max 12.7 max 4.25 Dia. 4.15 1 2 3
• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high accuracy masking for tig
Datasheet
15
BUL52

Seme LAB
NPN Transistor
TO220
• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high accuracy masking for tight control of characteristics from bat
Datasheet
16
BUL52AFI

Seme LAB
NPN Transistor
2.54 2.54 ISOLATED TO220 Pin 1
  – Base Pin 2
  – Collectorn Pin3
  – Emitter
• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and
Datasheet
17
BUL52BFI

Seme LAB
NPN Transistor

• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high accuracy masking for tight control of characteristics from batch to
Datasheet
18
BUL53B

Seme LAB
NPN Transistor
2.54 2.54 TO220 Pin 1
  – Base Pin 2
  – Collector Pin 3
  – Emitter
• Multi
  –base for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high acc
Datasheet
19
BUL54ASMD

Seme LAB
NPN Transistor

• Multi
  –base design for efficient energy distribution across the chip resulting in significantly improved switching and energy ratings across full temperature range.
• Ion implant and high accuracy masking for tight control of characteristics from ba
Datasheet
20
BUL56BSMD

Seme LAB
NPN Transistor

• LOW SATURATION VOLTAGE
• ULTRA FAST TURN
  –ON AND TURN
  –OFF SWITCHING (tr / tf = 40ns) 1 3 0 .7 6 (0 .0 3 0 ) m in . 1 0 .6 9 (0 .4 2 1 ) 1 0 .3 9 (0 .4 0 9 ) 2 1 6 .0 2 (0 .6 3 1 ) 1 5 .7 3 (0 .6 1 9 ) APPLICATIONS 9 .6 9 .3 1 1 .5 1 1 .2 7 (0
Datasheet



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