The ’ABT8996 10-bit addressable scan ports (ASP) are members of the Texas Instruments (TI™) SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most SCOPE™ devices, the ASP is not a boundary-scannable device, rather, it applies TI’s a.
ion Without
Use of Shadow Protocols
D Connect (CON) Pin Provides Indication of
Primary-to-Secondary Connection
D High-Drive Outputs (
–32-mA IOH, 64-mA IOL)
Support Backplane Interface at Primary and
High Fanout at Secondary
D Package Options Include Plastic Small-
Outline (DW) and Thin Shrink Small-
Outline (PW) Packages, Ceramic Chip
Carriers (FK), and Ceramic DIPs (JT)
SN54ABT8996 . . . JT PACKAGE SN74ABT8996 . . . DW OR PW PACKAGE
(TOP VIEW)
A4 1 A3 2 A2 3 A1 4 A0 5 BYP 6 GND 7 PTDO 8 PTCK 9 PTMS 10 PTDI 11 PTRST 12
24 A5 23 A6 22 A7 21 A8 20 A9 19 VCC 18 CON 17 STDI 16 STCK 15 STMS 14 S.
No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
1 | SN74ABT821A |
Texas Instruments |
10-BIT BUS-INTERFACE FLIP-FLOPS | |
2 | SN74ABT823 |
Texas Instruments |
9-BIT BUS-INTERFACE FLIP-FLOPS | |
3 | SN74ABT8245 |
Texas Instruments |
SCAN TEST DEVICES | |
4 | SN74ABT827 |
Texas Instruments |
10-Bit Buffer/Drivers | |
5 | SN74ABT833 |
Texas Instruments |
8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS | |
6 | SN74ABT841A |
Texas Instruments |
10-BIT BUS-INTERFACE D-TYPE LATCHES | |
7 | SN74ABT843 |
Texas Instruments |
9-BIT BUS-INTERFACE D-TYPE LATCHES | |
8 | SN74ABT8543 |
Texas Instruments |
SCAN TEST DEVICES | |
9 | SN74ABT861 |
Texas Instruments |
10-BIT TRANSCEIVERS | |
10 | SN74ABT863 |
Texas Instruments |
9-BIT BUS TRANSCEIVERS | |
11 | SN74ABT8646 |
Texas Instruments |
SCAN TEST DEVICES | |
12 | SN74ABT8652 |
Texas Instruments |
SCAN TEST DEVICES |