The SN54ABT841 and SN74ABT841A 10-bit latches are designed specifically for driving highly capacitive or relatively low-impedance loads. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers. The ten transparent D-type latches provide true data at their outputs. 4 3 2 1 28 27 26 3D 5 .
3 LE SN54ABT841 . . . FK PACKAGE (TOP VIEW) 2Q 1Q VCC NC OE 1D 2D description The SN54ABT841 and SN74ABT841A 10-bit latches are designed specifically for driving highly capacitive or relatively low-impedance loads. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers. The ten transparent D-type latches provide true data at their outputs. 4 3 2 1 28 27 26 3D 5 25 3Q 4D 6 24 4Q 5D 7 23 5Q NC 8 22 NC 6D 9 21 6Q 7D 10 20 7Q 8D 11 19 8Q 12 13 14 15 16 17 18 9Q 10Q LE NC GND 10D 9D A buffered o.
No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
1 | SN74ABT843 |
Texas Instruments |
9-BIT BUS-INTERFACE D-TYPE LATCHES | |
2 | SN74ABT821A |
Texas Instruments |
10-BIT BUS-INTERFACE FLIP-FLOPS | |
3 | SN74ABT823 |
Texas Instruments |
9-BIT BUS-INTERFACE FLIP-FLOPS | |
4 | SN74ABT8245 |
Texas Instruments |
SCAN TEST DEVICES | |
5 | SN74ABT827 |
Texas Instruments |
10-Bit Buffer/Drivers | |
6 | SN74ABT833 |
Texas Instruments |
8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS | |
7 | SN74ABT8543 |
Texas Instruments |
SCAN TEST DEVICES | |
8 | SN74ABT861 |
Texas Instruments |
10-BIT TRANSCEIVERS | |
9 | SN74ABT863 |
Texas Instruments |
9-BIT BUS TRANSCEIVERS | |
10 | SN74ABT8646 |
Texas Instruments |
SCAN TEST DEVICES | |
11 | SN74ABT8652 |
Texas Instruments |
SCAN TEST DEVICES | |
12 | SN74ABT8996 |
Texas Instruments |
MULTIDROP-ADDRESSABLE IEEE STD 1149.1 TAP TRANSCEIVERS |