The ’ABT8652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test acc.
652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. A2 A3 GND A4 A5 A6 A7 SN54ABT8652 . . . JT PACKAGE SN74ABT8652 . . . DL OR DW PACKAGE (TOP VIEW) CLKAB 1 SAB 2 OEAB 3 A1 4 A2 5 A3 6 GND 7 A4 8 A5 9 A6 10 A7 11 A8 12 TDO 13 TMS 14 28 CLKBA 27 SBA 26 OEBA 25 B1 24 B2 23.
No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
1 | SN74ABT861 |
Texas Instruments |
10-BIT TRANSCEIVERS | |
2 | SN74ABT863 |
Texas Instruments |
9-BIT BUS TRANSCEIVERS | |
3 | SN74ABT8646 |
Texas Instruments |
SCAN TEST DEVICES | |
4 | SN74ABT821A |
Texas Instruments |
10-BIT BUS-INTERFACE FLIP-FLOPS | |
5 | SN74ABT823 |
Texas Instruments |
9-BIT BUS-INTERFACE FLIP-FLOPS | |
6 | SN74ABT8245 |
Texas Instruments |
SCAN TEST DEVICES | |
7 | SN74ABT827 |
Texas Instruments |
10-Bit Buffer/Drivers | |
8 | SN74ABT833 |
Texas Instruments |
8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS | |
9 | SN74ABT841A |
Texas Instruments |
10-BIT BUS-INTERFACE D-TYPE LATCHES | |
10 | SN74ABT843 |
Texas Instruments |
9-BIT BUS-INTERFACE D-TYPE LATCHES | |
11 | SN74ABT8543 |
Texas Instruments |
SCAN TEST DEVICES | |
12 | SN74ABT8996 |
Texas Instruments |
MULTIDROP-ADDRESSABLE IEEE STD 1149.1 TAP TRANSCEIVERS |