SN74ABT8245 - Texas Instruments

SN74ABT8245 SCAN TEST DEVICES

The ’ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP.

Features

vers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. SN54ABT8245 . . . JT PACKAGE SN74ABT8245 . . . DW PACKAGE (TOP VIEW) DIR 1 B1 2 B2 3 B3 4 B4 5 GND 6 B5 7 B6 8 B7 9 B8 10 TDO 11 TMS 12 24 OE 23 A1 22 A2 21 A3 20 A4 19 A5 18 VCC 17 A6 16 A7 15 A8 14 TDI 13 TCK SN54ABT8245 . . . FK PACKAGE (TOP VIEW) A3 A4 A5 NC V CC A6 A7 4.