This device contains three independent 3-input NAND gates. Each gate performs the Boolean function Y = A ● B ● C in positive logic. Device Information(1) PART NUMBER PACKAGE BODY SIZE (NOM) SN74HC10QPWRG4Q 1 TSSOP (14) 5.00 mm × 4.40 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Functional pinout of the .
•1 AEC-Q100 Qualified for automotive applications:
– Device temperature grade 1:
–40°C to +125°C, TA
• Buffered inputs
• Positive and negative input clamp diodes
• Wide operating voltage range: 2 V to 6 V
• Supports fanout up to 10 LSTTL loads
• Significant power reduction compared to LSTTL
logic ICs
2 Applications
• Alarm / tamper detect circuit
• S-R latch
3 Description
This device contains three independent 3-input NAND gates. Each gate performs the Boolean function Y = A
● B
● C in positive logic.
Device Information(1)
PART NUMBER
PACKAGE
BODY SIZE (NOM)
SN74HC10QPWRG4Q 1
TSSOP (14.
No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
1 | SN74HC10-EP |
Texas Instruments |
TRIPLE 3-INPUT POSITIVE-NAND GATE | |
2 | SN74HC10 |
Texas Instruments |
Triple 3-Input NAND Gates | |
3 | SN74HC109 |
Texas Instruments |
DUAL J-K POSITIVE-EDGE-TRIGGERED FLIP-FLOPS | |
4 | SN74HC109N |
Texas Instruments |
DUAL J-K POSITIVE-EDGE-TRIGGERED FLIP-FLOPS | |
5 | SN74HC10D |
Texas Instruments |
Triple 3-Input NAND Gates | |
6 | SN74HC10N |
Texas Instruments |
TRIPLE 3-INPUT POSITIVE-NAND GATES | |
7 | SN74HC11 |
Texas Instruments |
Triple 3-Input AND Gates | |
8 | SN74HC112 |
Texas Instruments |
DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS | |
9 | SN74HC112N |
Texas Instruments |
DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS | |
10 | SN74HC125 |
Texas Instruments |
Quadruple Buffers | |
11 | SN74HC125-Q1 |
Texas Instruments |
Automotive Quadruple Buffers | |
12 | SN74HC125D |
Texas Instruments |
Quadruple Buffers |