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SN74HC10-Q1 |
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| Part Number | SN74HC10-Q1 |
| Manufacturer | Texas Instruments (https://www.ti.com/) |
| Description | This device contains three independent 3-input NAND gates. Each gate performs the Boolean function Y = A ● B ● C in positive logic. Device Information(1) PART NUMBER PACKAGE BODY SIZE (NOM) SN74H... |
| Features |
•1 AEC-Q100 Qualified for automotive applications: – Device temperature grade 1: –40°C to +125°C, TA • Buffered inputs • Positive and negative input clamp diodes • Wide operating voltage range: 2 V to 6 V • Supports fanout up to 10 LSTTL loads • Significant power reduction compared to LSTTL logic ICs 2 Applications • Alarm / tamper detect circuit • S-R latch 3 Description This device contains three independent 3-input NAND gates. Each gate performs the Boolean function Y = A ● B ● C in positive logic. Device Information(1) PART NUMBER PACKAGE BODY SIZE (NOM) SN74HC10QPWRG4Q 1 TSSOP (14... |
| Document |
 SN74HC10-Q1 Data Sheet
PDF 889.31KB |
| Distributor | Stock | Price | Buy |
|---|
| No. | Parte # | Fabricante | Descripción | Hoja de Datos |
|---|---|---|---|---|
| 1 | SN74HC10-EP |
Texas Instruments |
TRIPLE 3-INPUT POSITIVE-NAND GATE |
|
| 2 | SN74HC10 |
Texas Instruments |
Triple 3-Input NAND Gates |
|
| 3 | SN74HC109 |
Texas Instruments |
DUAL J-K POSITIVE-EDGE-TRIGGERED FLIP-FLOPS |
|
| 4 | SN74HC109N |
Texas Instruments |
DUAL J-K POSITIVE-EDGE-TRIGGERED FLIP-FLOPS |
|
| 5 | SN74HC10D |
Texas Instruments |
Triple 3-Input NAND Gates |
|