. .6 Part-Numbering Information. . .9 Valid Part Numbe.
• Single device supports asynchronous, page, and burst operations
• Vcc, VccQ Voltages 1.7V
–1.95V Vcc 1.7V
–1.95V VccQ
• Random Access Time: 70ns
• Burst Mode READ and WRITE Access 4, 8, 16, or 32 words, or continuous burst Burst wrap or sequential MAX clock rate: 104 MHz (tCLK = 9.62ns) Burst initial latency: 39ns (4 clocks) @ 104 MHz t ACLK: 7ns @ 104 MHz
• Page Mode Read Access Sixteen-word page size Interpage read access: 70ns Intrapage read access: 20ns
• Low Power Consumption Asynchronous READ: < 30mA Intrapage Read: < 15mA Initial access, burst READ: (39ns [4 clocks] @ 104 MHz) < 40mA Co.
No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
1 | MT45W2ML16PFA |
Micron Semiconductor |
(MT45WxMx16PFA) Async Cellularram Memory | |
2 | MT45W2MV16PFA |
Micron Semiconductor |
(MT45WxMx16PFA) Async Cellularram Memory | |
3 | MT45W2MW16B |
Micron Semiconductor |
(MT45W2MW16B / MT45W4MW16B) Burst Cellularram Memory | |
4 | MT45W2MW16BFB |
Micron Semiconductor |
(MT45W2MW16BFB / MT45W4MW16BFB) Burst Cellularram Memory | |
5 | MT45W2MW16PFA |
Micron Semiconductor |
(MT45WxMx16PFA) Async Cellularram Memory | |
6 | MT45W4ML16PFA |
Micron Semiconductor |
(MT45WxMx16PFA) Async Cellularram Memory | |
7 | MT45W4MV16PFA |
Micron Semiconductor |
(MT45WxMx16PFA) Async Cellularram Memory | |
8 | MT45W4MW16B |
Micron Semiconductor |
(MT45W2MW16B / MT45W4MW16B) Burst Cellularram Memory | |
9 | MT45W4MW16BFB |
Micron Semiconductor |
(MT45W2MW16BFB / MT45W4MW16BFB) Burst Cellularram Memory | |
10 | MT45W4MW16PFA |
Micron Semiconductor |
(MT45WxMx16PFA) Async Cellularram Memory | |
11 | MT4505 |
Magn Tek |
High Performance Ratiometric Linear Hall Effect Sensor | |
12 | MT4506 |
Magn Tek |
High Performance Ratiometric Linear Hall Effect Sensor |