• Single Voltage, 2.7V to 3.6V for Read and Write operations • Organization 4,194,304 x 8 bit (Byte mode) / 2,097,152 x 16 bit (Word mode) • Fast Read Access Time : 70ns • Read While Program/Erase Operation • Dual Bank architectures Bank 1 / Bank 2 : 8Mb / 24Mb • Secode(Security Code) Block : Extra 64K Byte block • Power Consumption (typical value @5MHz) - .
GENERAL DESCRIPTION
• Single Voltage, 2.7V to 3.6V for Read and Write operations
• Organization
4,194,304 x 8 bit (Byte mode) / 2,097,152 x 16 bit (Word mode)
• Fast Read Access Time : 70ns
• Read While Program/Erase Operation
• Dual Bank architectures
Bank 1 / Bank 2 : 8Mb / 24Mb
• Secode(Security Code) Block : Extra 64K Byte block
• Power Consumption (typical value @5MHz)
- Read Current : 14mA - Program/Erase Current : 15mA - Read While Program or Read While Erase Current : 25mA - Standby Mode/Auto Sleep Mode : 5µA
• WP/ACC input pin
- Allows special protection of two outermost boot blocks.
No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
1 | K8D3216U |
Samsung |
32M-Bit (4M x8/2M x16) Dual Bank NOR Flash Memory | |
2 | K8D3216UT |
Samsung |
32M-Bit (4M x8/2M x16) Dual Bank NOR Flash Memory | |
3 | K8D1716U |
Samsung |
16M Dual Bank NOR Flash Memory | |
4 | K8D1716UBB |
Samsung |
16M Dual Bank NOR Flash Memory | |
5 | K8D1716UBC |
Samsung semiconductor |
16M Bit (2M x8/1M x16) Dual Bank NOR Flash Memory | |
6 | K8D1716UBC |
Samsung Electronics |
16M-Bit Dual Bank NOR Flash Memory | |
7 | K8D1716UTB |
Samsung |
16M Dual Bank NOR Flash Memory | |
8 | K8D1716UTC |
Samsung semiconductor |
16M Bit (2M x8/1M x16) Dual Bank NOR Flash Memory | |
9 | K8D1716UTC |
Samsung Electronics |
16M-Bit Dual Bank NOR Flash Memory | |
10 | K8D6316UBM |
Samsung semiconductor |
(K8D6x16UxM) 64M Bit (8M x8/4M x16) Dual Bank NOR Flash Memory | |
11 | K8D6316UTM |
Samsung semiconductor |
(K8D6x16UxM) 64M Bit (8M x8/4M x16) Dual Bank NOR Flash Memory | |
12 | K8D638UBM |
Samsung semiconductor |
(K8D6x16UxM) 64M Bit (8M x8/4M x16) Dual Bank NOR Flash Memory |