F60UP20DN using the lastest FRED FAB process(planar passivation chip) with ultrafast and soft recovery characteristic. ABSOLUTE MAXIMUM RATINGS TC=25°C unless otherwise specified Symbol Parameter Test Conditions Values Unit VR Maximum D.C. Reverse Voltage 200 V V RRM Maximum Repetitive Reverse Voltage 200 V I F(AV) Average Forward Current TC=.
M
RMS Forward Current Non-Repetitive Surge Forward Current
TC=100°C, Per Diode TJ=45°C, t=10ms, 50Hz, Sine
53 300
A A
PD Power Dissipation
156 W
TJ Junction Temperature
-40 to +150
°C
T STG Torque
Storage Temperature Range Module-to-Sink
Recommended(M3)
-40 to +150 1.1
°C N
·m
R θJC
Thermal Resistance
Weight
ELECTRICAL CHARACTERISTICS
Junction-to-Case
0.8 °C /W 6.0 g TC=25°C unless otherwise specified
Symbol
Parameter
IRM Reverse Leakage Current
Test Conditions VR=200V VR=200V, TJ=125°C
Min. Typ. Max. -- -- 25 -- -- 250
Unit µA µA
VF Forward Voltage
I F =30A IF=30A, .
No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
1 | F60UP30DN |
Fairchild Semiconductor |
FFAF60UP30DN | |
2 | F60UP30DN |
Thinki Semiconductor |
Ultra Fast Recovery Rectifiers | |
3 | F60UA60DN |
Fairchild Semiconductor |
FFAF60UA60DN | |
4 | F6005 |
CSF |
Triode | |
5 | F6043 |
CSF |
Triode | |
6 | F6047 |
CSF |
Triode | |
7 | F6051 |
CSF |
Triode | |
8 | F6053 |
CSF |
Tube | |
9 | F60800010 |
Pericom Semiconductor |
TYPE F6 6x3.5 GLASS SEALED CRYSTAL | |
10 | F60B150DS |
Fairchild Semiconductor |
FFPF60B150DS | |
11 | F60N06P |
KEC |
KF60N06P | |
12 | F60SA60DS |
Thinki Semiconductor |
16.0 Ampere Insulated Stealth Dual Series Connection Fast Recovery Rectifiers |