SN74ABTH182504A - Texas Instruments

SN74ABTH182504A SCAN TEST DEVICES

The ’ABTH18504A and ’ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via th.

Features

Pattern Generation From Outputs
  – Sample Inputs/Toggle Outputs
  – Binary Count From Outputs
  – Device Identification
  – Even-Parity Opcodes D Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV) Packages Using 25-mil Center-to-Center Spacings SN54ABTH18504A, SN54ABTH182504A . . . HV PACKAGE (TOP VIEW) A3 A2 A1 GND OEBA LEBA TDO VCC NC TMS CLKBA CLKENBA B1 GND B2 B3 B4 A4 A5 A6 GND A7 A8 A9 A10 NC VCC A11 A12 A13 GND A14 A15 A16 9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61 10 60 11 59 12 58 13 57 14 56 15 55 .