The SN54ABT16260 and SN74ABTH16260 are 12-bit to 24-bit multiplexed D-type latches used in applications in which two separate data paths must be multiplexed onto, or demultiplexed from, a single data path. Typical applications include multiplexing and/or demultiplexing of address and data information in microprocessor or bus-interface applications. This devi.
ription The SN54ABT16260 and SN74ABTH16260 are 12-bit to 24-bit multiplexed D-type latches used in applications in which two separate data paths must be multiplexed onto, or demultiplexed from, a single data path. Typical applications include multiplexing and/or demultiplexing of address and data information in microprocessor or bus-interface applications. This device is also useful in memory-interleaving applications. SN54ABT16260 . . . WD PACKAGE SN74ABTH16260 . . . DL PACKAGE (TOP VIEW) OEA 1 LE1B 2 2B3 3 GND 4 2B2 5 2B1 6 VCC 7 A1 8 A2 9 A3 10 GND 11 A4 12 A5 13 A6 14 A7 15 A8 16 A9 17 G.
No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
1 | SN74ABTH162245 |
Texas Instruments |
16-BIT BUS TRANSCEIVERS | |
2 | SN74ABTH162260 |
Texas Instruments |
12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES | |
3 | SN74ABTH16244 |
Texas Instruments |
16-BIT BUFFERS/DRIVERS | |
4 | SN74ABTH16245 |
Texas Instruments |
16-BIT BUS TRANSCEIVERS | |
5 | SN74ABTH16823 |
Texas Instruments |
18-BIT BUS-INTERFACE FLIP-FLOPS | |
6 | SN74ABTH182502A |
Texas Instruments |
SCAN TEST DEVICES | |
7 | SN74ABTH182504A |
Texas Instruments |
SCAN TEST DEVICES | |
8 | SN74ABTH182646A |
Texas Instruments |
SCAN TEST DEVICES | |
9 | SN74ABTH182652A |
Texas Instruments |
SCAN TEST DEVICES | |
10 | SN74ABTH18502A |
Texas Instruments |
SCAN TEST DEVICES | |
11 | SN74ABTH18504A |
Texas Instruments |
SCAN TEST DEVICES | |
12 | SN74ABTH18646A |
Texas Instruments |
SCAN TEST DEVICES |