SN54ABT18504 - Texas Instruments

SN54ABT18504 SCAN TEST DEVICE

The SN54ABT18504 and SN74ABT18504 scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability IC family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test .

Features

Thin Quad Flat Pack Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat Pack Using 25-mil Center-to-Center Spacings SN54ABT18504 . . . HV PACKAGE (TOP VIEW) A3 A2 A1 GND OEBA LEBA TDO VCC NC TMS CLKBA CLKENBA B1 GND B2 B3 B4 A4 A5 A6 GND A7 A8 A9 A10 NC VCC A11 A12 A13 GND A14 A15 A16 9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61 10 60 11 59 12 58 13 57 14 56 15 55 16 54 17 53 18 52 19 51 20 50 21 49 22 48 23 47 24 46 25 45 26 44 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 B5 B6 B7 GND B8 B9 B10 VCC NC B11 B12 B13 B14 GND B15 B16 B17 .