SN54ABT18245A - Texas Instruments

SN54ABT18245A SCAN TEST DEVICES

The ’ABT18245A scan test devices with 18-bit bus transceivers are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TA.

Features

atedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. SN54ABT18245A . . . WD PACKAGE SN74ABT18245A . . . DGG OR DL PACKAGE (TOP VIEW) 1DIR 1 1B1 2 1B2 3 GND 4 1B3 5 1B4 6 VCC 7 1B5 8 1B6 9 1B7 10 GND 11 1B8 12 1B9 13 2B1 14 2B2 15 2B3 16 2B4 17 GND 18 2B5 19 2B6 20 2B7 21 VCC 22 2B8 23 2B9 24 GND 25 2DIR 26 TDO 27 TMS 28 56 1OE 55 1A1 54 1A2 53 GND 52 1A3 51 1A4 50 VCC 49 1A5 48 1A6 47 1A7 46 GND 4.