The HEF4011B-Q100 is a quad 2-input NAND gate. The outputs are fully buffered for the highest noise immunity and pattern insensitivity to output impedance. It operates over a recommended VDD power supply range of 3 V to 15 V referenced to VSS (usually ground). Unused inputs must be connected to VDD, VSS, or another input. This product has been qualified to .
Automotive product qualification in accordance with AEC-Q100 (Grade 1) Specified from 40 C to +85 C and from 40 C to +125 C
Fully static operation
5 V, 10 V, and 15 V parametric ratings
Standardized symmetrical output characteristics
ESD protection:
MIL-STD-833, method 3015 exceeds 2000 V HBM JESD22-A114F exceeds 2000 V MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 )
Complies with JEDEC standard JESD 13-B
3. Ordering information
Table 1. Ordering information All types operate from 40 C to +125 C
Type number
Package
Name Description
HEF4011BT-Q100 SO14 pl.
No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
1 | HEF4011B |
NXP |
Quadruple 2-input NAND gate | |
2 | HEF4011B |
Philips |
Quadruple 2-input NAND gate | |
3 | HEF4011B |
nexperia |
Quad 2-input NAND gate | |
4 | HEF4011UB |
NXP |
Quadruple 2-input NAND gate | |
5 | HEF40106B |
NXP |
Hex inverting Schmitt trigger | |
6 | HEF40106B |
Philips |
Hex inverting Schmitt trigger | |
7 | HEF40106B |
nexperia |
Hex inverting Schmitt trigger | |
8 | HEF40106B-Q100 |
nexperia |
Hex inverting Schmitt trigger | |
9 | HEF4012B |
NXP |
Dual 4-input NAND gate | |
10 | HEF4013B |
NXP |
Dual D-type flip-flop | |
11 | HEF4013B |
nexperia |
Dual D-type flip-flop | |
12 | HEF4013B-Q100 |
nexperia |
Dual D-type flip-flop |