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Th.
Pinouts
• 3 Micron Radiation Hardened CMOS SOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm2/mg
• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/
Bit-Day (Typ)
• Dose Rate Survivability: >1 x 1012 RAD (Si)/s
• Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55oC to +125oC
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility - VIL = 0.8V Max - VIH = 2.0V Min
• Input Current Levels Ii ≤ 5µA at VOL, VOH
16 LEAD CERAMIC DUAL-IN-LINE M.
| No. | Partie # | Fabricant | Description | Fiche Technique |
|---|---|---|---|---|
| 1 | HCTS393MS |
Intersil Corporation |
Radiation Hardened Dual 4-Stage Binary Counter |
|
| 2 | HCTS30MS |
Intersil Corporation |
Radiation Hardened 8-Input NAND Gate |
|
| 3 | HCTS32MS |
Intersil Corporation |
Radiation Hardened Quad 2-Input OR Gate |
|
| 4 | HCTS365MS |
Intersil Corporation |
Radiation Hardened Hex Buffer/Line Driver Non-Inverting |
|
| 5 | HCTS373MS |
Intersil Corporation |
Radiation Hardened Octal Transparent Latch |
|
| 6 | HCTS373T |
Intersil Corporation |
Radiation Hardened Octal Transparent Latch/ Three-State |
|
| 7 | HCTS374MS |
Intersil Corporation |
Radiation Hardened Octal D-Type Flip-Flop |
|
| 8 | HCTS374T |
Intersil Corporation |
Radiation Hardened Octal D-Type Flip-Flop |
|
| 9 | HCTS00MS |
Intersil Corporation |
Radiation Hardened Quad 2-Input NAND Gate |
|
| 10 | HCTS02MS |
Intersil Corporation |
Radiation Hardened Quad 2-Input NOR Gate |
|
| 11 | HCTS04MS |
Intersil Corporation |
Radiation Hardened Hex Inverter |
|
| 12 | HCTS08MS |
Intersil Corporation |
Radiation Hardened Quad 2-Input AND Gate |
|