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HCTS30MS - Intersil Corporation

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HCTS30MS Radiation Hardened 8-Input NAND Gate

The Intersil HCTS30MS is a Radiation Hardened 8-Input NAND Gate. A high on all input forces the output to a low state. The HCTS30MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family. B C D E F GND Ordering Information PART NUMBER HCTS30DMSR HCTS30KMSR HCTS.

Features


• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm2/mg
• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ)
• Dose Rate Survivability: >1 x
• Dose Rate Upset >10 10 1012 RAD (Si)/s RAD (Si)/s 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55oC to +125oC
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility - VIL = 0.8V Max - VIH = VCC/2 Min
• Input Current Levels Ii ≤ 5µA at VOL, VOH A 14 LEAD CERAMIC METAL SEAL FLATP.

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