Recherchez avec le numéro de pièce ainsi que le fabricant ou la description
Electrical Life Test (Early Failure Rate) 48 hours 140°C Electrical Life Test (Latent Failure Rate) 1000 hours 140°C Dynamic or Static Electrostatic Discharge HBM +/-2000v 1.5kOhm/100pF/3 pulses Latch up 50mW power injection, 50% overvoltage @125°C NVM Endurance Program Erase Cycles 25°C NVM Data Retention High Temperature Storage 165°C Temperature Cycling 1.
5 3.3 DEVICE CROSS SECTION ..... 6 4 QUALIFICATION ... 7 4.1 QUALIFICATION METHODOLOGY ..... 7 4.2 QUALIFICATION TES.
| No. | Partie # | Fabricant | Description | Fiche Technique |
|---|---|---|---|---|
| 1 | 89C51 |
NXP |
80C51 8-bit microcontroller family 4K/8K/16K/32K Flash |
|
| 2 | 89C51 |
NXP |
80C51 8-bit microcontroller family 4K/8K/16K/32K Flash |
|
| 3 | 89C51 |
atmel |
8 Bit Microcontroller with 4 Kbytes Flash |
|
| 4 | 89C5122 |
ATMEL Corporation |
AT89C5122 |
|
| 5 | 89C5131 |
ATMEL Corporation |
AT89C5131 |
|
| 6 | 89C516RD |
ETC |
ST89C516RD |
|
| 7 | 89C51AC2 |
ATMEL Corporation |
Enhanced 8-bit Microcontroller |
|
| 8 | 89C51CC01 |
ATMEL Corporation |
T89C51CC01 |
|
| 9 | 89C51RB2 |
NXP |
80C51 8-bit Flash microcontroller family 16KB/32KB/64KB ISP/IAP Flash with 512B/512B/1KB RAM |
|
| 10 | 89C51RC |
ATMEL Corporation |
AT89C51RC |
|
| 11 | 89C51RC2 |
NXP |
80C51 8-bit Flash microcontroller family 16KB/32KB/64KB ISP/IAP Flash with 512B/512B/1KB RAM |
|
| 12 | 89C51RD2 |
NXP |
80C51 8-bit Flash microcontroller family 16KB/32KB/64KB ISP/IAP Flash with 512B/512B/1KB RAM |
|