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89C51ED2 |
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| Part Number | 89C51ED2 |
| Manufacturer | ATMEL Corporation |
| Description | Electrical Life Test (Early Failure Rate) 48 hours 140°C Electrical Life Test (Latent Failure Rate) 1000 hours 140°C Dynamic or Static Electrostatic Discharge HBM +/-2000v 1.5kOhm/100pF/3 pulses Latch... |
| Features |
5 3.3 DEVICE CROSS SECTION ..... 6 4 QUALIFICATION ... 7 4.1 QUALIFICATION METHODOLOGY ..... 7 4.2 QUALIFICATION TES... |
| Document |
 89C51ED2 Data Sheet
PDF 1.38MB |
| Distributor | Stock | Price | Buy |
|---|
| No. | Parte # | Fabricante | Descripción | Hoja de Datos |
|---|---|---|---|---|
| 1 | 89C51 |
NXP |
80C51 8-bit microcontroller family 4K/8K/16K/32K Flash |
|
| 2 | 89C51 |
NXP |
80C51 8-bit microcontroller family 4K/8K/16K/32K Flash |
|
| 3 | 89C51 |
atmel |
8 Bit Microcontroller with 4 Kbytes Flash |
|
| 4 | 89C5122 |
ATMEL Corporation |
AT89C5122 |
|
| 5 | 89C5131 |
ATMEL Corporation |
AT89C5131 |
|