The 74HC74-Q100; 74HCT74-Q100 are dual positive edge triggered D-type flip-flop with individual data (nD), clock (nCP), set (nSD) and reset (nRD) inputs, and complementary nQ and nQ outputs. Data at the nD-input, that meets the set-up and hold time requirements on the LOW-to-HIGH clock transition, will be stored in the flip-flop and appear at the nQ output. .
• Automotive product qualification in accordance with AEC-Q100 (Grade 1)
• Specified from -40 °C to +85 °C and from -40 °C to +125 °C
• Input levels:
• For 74HC74-Q100: CMOS level
• For 74HCT74-Q100: TTL level
• Symmetrical output impedance
• Low power dissipation
• High noise immunity
• Balanced propagation delays
• Specified in compliance with JEDEC standard no. 7A
• ESD protection:
• MIL-STD-883, method 3015 exceeds 2000 V
• HBM JESD22-A114F exceeds 2000 V
• MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)
• Multiple package options
• DHVQFN package with Side-Wettable Flanks enabling Au.
No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
1 | 74HC74 |
nexperia |
Dual D-type flip-flop | |
2 | 74HC74 |
Texas Instruments |
Dual D-Type Positive-Edge-Triggered Flip-Flops | |
3 | 74HC74 |
ON Semiconductor |
Dual D Flip-Flop | |
4 | 74HC7403 |
Philips |
4-Bit x 64-word FIFO register | |
5 | 74HC7403 |
NXP |
4-bit x 64-word FIFO register | |
6 | 74HC7404 |
Philips |
5-Bit x 64-word FIFO register | |
7 | 74HC74A |
Fairchild Semiconductor |
Dual D-Type Flip-Flop | |
8 | 74HC74A |
ON Semiconductor |
Dual D Flip-Flop | |
9 | 74HC74AF |
Toshiba |
Dual D-Type Flip-Flop | |
10 | 74HC74AP |
Toshiba Semiconductor |
Dual D-Type Flip-Flop | |
11 | 74HC74D |
Toshiba |
Dual D-Type Flip-Flop | |
12 | 74HC74D |
nexperia |
Dual D-type flip-flop |