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DS21354 |
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| Part Number | DS21354 |
| Manufacturer | Dallas Semiconducotr |
| Description | A description of this device can be found in the product data sheet. You can find the product data sheet at http://dbserv.maxim-ic.com/l_datasheet3.cfm. Reliability Derating: The Arrhenius model will... |
| Features |
rating: The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that are temperature accelerated. AfT = exp((Ea/k)*(1/Tu - 1/Ts)) = tu/ts AfT = Acceleration factor due to Temperature tu = Time at use temperature (e.g. 55°C) ts = Time at stress temperature (e.g. 125°C) k = Boltzmann’s Constant (8.617 x 10-5 eV/°K) Tu = Temperature at Use (°K) Ts = Temperature at Stress (°K) Ea = Activation Energy (e.g. 0.7 ev) The activation energy of the failure mechanism is derived from either internal studies or industry accepted standards, or activation energy of 0.7ev w... |
| Document |
 DS21354 Data Sheet
PDF 17.09KB |
| Distributor | Stock | Price | Buy |
|---|
| No. | Parte # | Fabricante | Descripción | Hoja de Datos |
|---|---|---|---|---|
| 1 | DS21352 |
Dallas Semiconducotr |
3.3V DS21352 and 5V DS21552 T1 Single-Chip Transceivers |
|
| 2 | DS21348 |
Maxim Integrated |
3.3V E1/T1/J1 Line Interface |
|
| 3 | DS21348 |
Dallas Semiconducotr |
3.3V E1/T1/J1 Line Interface |
|
| 4 | DS21372 |
Dallas Semiconducotr |
3.3V Bit Error Rate Tester BERT |
|
| 5 | DS21054E |
Microchip Technology |
16K 1.8V I2C SERIAL EEPROM |
|