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SN74AHC1G02-EP |
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| Part Number | SN74AHC1G02-EP |
| Manufacturer | Texas Instruments (https://www.ti.com/) |
| Description | ORDERING INFORMATION This device contains a single 2-input NOR gate that performs the Boolean function Y = A • B or Y = A + B in positive logic. ORDERING INFORMATION(1) TA –55°C to 125°C PACKAGE (2... |
| Features |
1
• Controlled Baseline – One Assembly Site – One Test Site – One Fabrication Site • Extended Temperature Performance of –55°C to 125°C • Enhanced Diminishing Manufacturing Sources (DMS) Support • Enhanced Product-Change Notification • Qualification Pedigree (1) (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold comp... |
| Document |
 SN74AHC1G02-EP Data Sheet
PDF 764.28KB |
| Distributor | Stock | Price | Buy |
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| No. | Partie # | Fabricant | Description | Fiche Technique |
|---|---|---|---|---|
| 1 | SN74AHC1G02 |
Texas Instruments |
Positive-NOR Gate |
|
| 2 | SN74AHC1G00 |
Texas Instruments |
Positive-NAND Gate |
|
| 3 | SN74AHC1G00-Q1 |
Texas Instruments |
Positive-NAND Gate |
|
| 4 | SN74AHC1G04 |
Texas Instruments |
Single Inverter Gate |
|
| 5 | SN74AHC1G04-Q1 |
Texas Instruments |
Automotive Single Inverter Gate |
|