logo

Toshiba C54 DataSheet

No. Partie # Fabricant Description Fiche Technique
1
C5404

Toshiba Semiconductor
2SC5404
Datasheet
2
C5460

Toshiba
2SC5460
ings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure
Datasheet
3
TC54512

Toshiba
8-Bit CMOS Time Programmable ROM
Datasheet
4
C547

Toshiba
2SC547
Datasheet
5
TBC547

Toshiba
Silicon NPN Transistor
. High VqeO High hpE Low Noise 65V (TBC546) 45V (TBC547) 30V (TBC548) 110-800 TBC546 TBC547 TBC548 Unit in mm 5.1 MAX. r -i . MAXIMUM RATINGS (Ta=25 C) CHARACTERISTIC SYMBOL Collector-Base Breakdown Voltage TBC546 TBC547 v (BR)CBO TBC548
Datasheet
6
C5411

Toshiba Semiconductor
2SC5411
tter Saturation Voltage Transition Frequency Collector Output Capacitance Switching Time Storage Time Fall Time ICBO IEBO V (BR) CEO hFE (1) hFE (2) VCE (sat) VBE (sat) fT Cob tstg tf VCB = 1500 V, IE = 0 VEB = 5 V, IC = 0 IC = 10 mA, IB = 0 VC
Datasheet
7
2SC5445

Toshiba Semiconductor
NPN TRANSISTOR
Datasheet
8
TC74VHC541F

Toshiba
Octal Bus Buffer

 High speed: tpd = 3.7 ns (typ.) at VCC = 5 V
 Low power dissipation: ICC = 4 A (max) at Ta = 25°C
 High noise immunity: VNIH = VNIL = 28% VCC (min)
 Power down protection is provided on all inputs.
 Balanced propagation delays: tpLH tpHL
Datasheet
9
C5459

Toshiba
2SC5459
ly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precaut
Datasheet
10
74HC541D

Toshiba
Octal Bus Buffer
(1) Wide operating temperature range: Topr = -40 to 125 � (Note 1) (2) High speed: tpd = 10 ns (typ.) at VCC = 6.0 V (3) Low power dissipation: ICC = 4.0 µA (max) at Ta = 25 � (4) Balanced propagation delays: tPLH ≈ tPHL (5) Wide operating voltage ra
Datasheet
11
2SC547

Toshiba
Silicon NPN epitaxial planar type Transistor
Datasheet
12
C5445

Toshiba
SILICON NPN TRIPLE DIFFUSED MESA TYPE TRANSISTOR
Storage Time Fall Time ICBO IEBO V (BR) CEO hFE (1) hFE (2) hFE (3) VCE (sat) VBE (sat) fT Cob tstg (1) tf (1) tstg (2) tf (2) VCB = 1500 V, IE = 0 VEB = 5 V, IC = 0 IC = 10 mA, IB = 0 VCE = 5 V, IC = 2 A VCE = 5 V, IC = 10 A VCE = 5 V, IC = 15 A
Datasheet
13
C5422

Toshiba Semiconductor
2SC5422
e Time Fall Time YMBOL ICBO IEBO V (BR) CEO hFE (1) hFE (2) VCE (sat) VBE (sat) fT Cob tstg tf TEST CONDITION VCB = 1700 V, IE = 0 VEB = 5 V, IC = 0 IC = 10 mA, IB = 0 VCE = 5 V, IC = 2 A VCE = 5 V, IC = 11 A IC = 11 A, IB = 2.75 A IC = 11 A, IB = 2.
Datasheet
14
C5466

Toshiba
2SC5466
ign the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 1 h
Datasheet
15
C5463

Toshiba
2SC5463
aracteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Collector cut-off current Emitter cut-off current DC current gain Output capacitance Reverse transfer capacitance ICBO VCB = 10 V, IE = 0 IEBO VEB = 1 V, IC =
Datasheet
16
C5468

Toshiba
2SC5468
Datasheet
17
74HC540D

Toshiba
Octal Bus Buffer
(1) Wide operating temperature range: Topr = -40 to 125 � (Note 1) (2) High speed: tpd = 10 ns (typ.) at VCC = 6.0 V (3) Low power dissipation: ICC = 4.0 µA (max) at Ta = 25 � (4) Balanced propagation delays: tPLH ≈ tPHL (5) Wide operating voltage ra
Datasheet
18
2SC5404

Toshiba Semiconductor
NPN TRANSISTOR
tput Capacitance Switching Time Storage Time Fall Time ICBO IEBO V (BR) CEO hFE (1) hFE (2) VCE (sat) VBE (sat) fT Cob tstg tf VCB = 1500 V, IE = 0 VEB = 5 V, IC = 0 IC = 10 mA, IB = 0 VCE = 5 V, IC = 1 A VCE = 5 V, IC = 7 A IC = 7 A, IB = 1.75 A
Datasheet
19
2SC5411

Toshiba Semiconductor
NPN TRANSISTOR
or Output Capacitance Switching Time Storage Time Fall Time SYMBOL ICBO IEBO V (BR) CEO hFE (1) hFE (2) VCE (sat) VBE (sat) fT Cob tstg tf TEST CONDITION VCB = 1500 V, IE = 0 VEB = 5 V, IC = 0 IC = 10 mA, IB = 0 VCE = 5 V, IC = 2 A VCE = 5 V, IC = 11
Datasheet
20
2SC5458

Toshiba Semiconductor
NPN TRANSISTOR
ctor-emitter breakdown voltage DC current gain Collector emitter saturation voltage Base-emitter saturation voltage Symbol Test Condition ICBO IEBO V (BR) CBO V (BR) CEO hFE VCE (sat) VBE (sat) VCB = 480 V, IE = 0 VEB = 7 V, IC = 0 IC = 1 mA, IE
Datasheet



Depuis 2018 :: D4U Semiconductor :: (Politique de confidentialité et contact