No. | Partie # | Fabricant | Description | Fiche Technique |
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Sangdest Microelectronics |
FAST RECOVERY RECTIFIERS DO-15 Diffused Junction Low Forward Voltage Drop High Current Capability High Reliability High Surge Current Capability This is a Pb − Free Device All SMC parts are traceable to the wafer lot Additional testing can be offered upon r |
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Sangdest Microelectronics |
FAST RECOVERY RECTIFIERS DO-15 Diffused Junction Low Forward Voltage Drop High Current Capability High Reliability High Surge Current Capability This is a Pb − Free Device All SMC parts are traceable to the wafer lot Additional testing can be offered upon r |
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SANGDEST MICROELECTRONICS |
2.0A SURFACE MOUNT FAST RECOVERY RECTIFIER assured safety or by means of users’ fail-safe precautions or other arrangement . 3- In no event shall SMC - Sangdest Microelectronics (Nanjing) Co., Ltd be liable for any damages that may result from an accident or any other cause during operation o |
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SANGDEST MICROELECTRONICS |
2.0A SURFACE MOUNT FAST RECOVERY RECTIFIER assured safety or by means of users’ fail-safe precautions or other arrangement . 3- In no event shall SMC - Sangdest Microelectronics (Nanjing) Co., Ltd be liable for any damages that may result from an accident or any other cause during operation o |
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Sangdest Microelectronics |
FAST RECOVERY RECTIFIERS DO-15 Diffused Junction Low Forward Voltage Drop High Current Capability High Reliability High Surge Current Capability This is a Pb − Free Device All SMC parts are traceable to the wafer lot Additional testing can be offered upon r |
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Sangdest Microelectronics |
FAST RECOVERY RECTIFIERS DO-15 Diffused Junction Low Forward Voltage Drop High Current Capability High Reliability High Surge Current Capability This is a Pb − Free Device All SMC parts are traceable to the wafer lot Additional testing can be offered upon r |
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Sangdest Microelectronics |
FAST RECOVERY RECTIFIERS DO-15 Diffused Junction Low Forward Voltage Drop High Current Capability High Reliability High Surge Current Capability This is a Pb − Free Device All SMC parts are traceable to the wafer lot Additional testing can be offered upon r |
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Sangdest Microelectronics |
FAST RECOVERY RECTIFIERS DO-15 Diffused Junction Low Forward Voltage Drop High Current Capability High Reliability High Surge Current Capability This is a Pb − Free Device All SMC parts are traceable to the wafer lot Additional testing can be offered upon r |
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Sangdest Microelectronics |
FAST RECOVERY RECTIFIERS DO-15 Diffused Junction Low Forward Voltage Drop High Current Capability High Reliability High Surge Current Capability This is a Pb − Free Device All SMC parts are traceable to the wafer lot Additional testing can be offered upon r |
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Sangdest Microelectronics |
FAST RECOVERY GLASS PASSIVATED RECTIFIERS DO-15 The plastic package carries Underwriters Laboratory Flammability Classification 94V-0 Fast switching for high efficiency Low reverse leakage High forward surge current capability High temperature soldering guaranteed: 260 C/10 secon |
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Sangdest Microelectronics |
FAST RECOVERY GLASS PASSIVATED RECTIFIERS DO-15 The plastic package carries Underwriters Laboratory Flammability Classification 94V-0 Fast switching for high efficiency Low reverse leakage High forward surge current capability High temperature soldering guaranteed: 260 C/10 secon |
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Sangdest Microelectronics |
FAST RECOVERY GLASS PASSIVATED RECTIFIERS DO-15 The plastic package carries Underwriters Laboratory Flammability Classification 94V-0 Fast switching for high efficiency Low reverse leakage High forward surge current capability High temperature soldering guaranteed: 260 C/10 secon |
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Sangdest Microelectronics |
FAST RECOVERY GLASS PASSIVATED RECTIFIERS DO-15 The plastic package carries Underwriters Laboratory Flammability Classification 94V-0 Fast switching for high efficiency Low reverse leakage High forward surge current capability High temperature soldering guaranteed: 260 C/10 secon |
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Sangdest Microelectronics |
FAST RECOVERY GLASS PASSIVATED RECTIFIERS DO-15 The plastic package carries Underwriters Laboratory Flammability Classification 94V-0 Fast switching for high efficiency Low reverse leakage High forward surge current capability High temperature soldering guaranteed: 260 C/10 secon |
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Sangdest Microelectronics |
FAST RECOVERY GLASS PASSIVATED RECTIFIERS DO-15 The plastic package carries Underwriters Laboratory Flammability Classification 94V-0 Fast switching for high efficiency Low reverse leakage High forward surge current capability High temperature soldering guaranteed: 260 C/10 secon |
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Sangdest Microelectronics |
FAST RECOVERY GLASS PASSIVATED RECTIFIERS DO-15 The plastic package carries Underwriters Laboratory Flammability Classification 94V-0 Fast switching for high efficiency Low reverse leakage High forward surge current capability High temperature soldering guaranteed: 260 C/10 secon |
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SANGDEST MICROELECTRONICS |
2.0A SURFACE MOUNT FAST RECOVERY RECTIFIER assured safety or by means of users’ fail-safe precautions or other arrangement . 3- In no event shall SMC - Sangdest Microelectronics (Nanjing) Co., Ltd be liable for any damages that may result from an accident or any other cause during operation o |
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SANGDEST MICROELECTRONICS |
2.0A SURFACE MOUNT FAST RECOVERY RECTIFIER assured safety or by means of users’ fail-safe precautions or other arrangement . 3- In no event shall SMC - Sangdest Microelectronics (Nanjing) Co., Ltd be liable for any damages that may result from an accident or any other cause during operation o |
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SANGDEST MICROELECTRONICS |
2.0A SURFACE MOUNT FAST RECOVERY RECTIFIER assured safety or by means of users’ fail-safe precautions or other arrangement . 3- In no event shall SMC - Sangdest Microelectronics (Nanjing) Co., Ltd be liable for any damages that may result from an accident or any other cause during operation o |
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SANGDEST MICROELECTRONICS |
2.0A SURFACE MOUNT FAST RECOVERY RECTIFIER assured safety or by means of users’ fail-safe precautions or other arrangement . 3- In no event shall SMC - Sangdest Microelectronics (Nanjing) Co., Ltd be liable for any damages that may result from an accident or any other cause during operation o |
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