| No. | Partie # | Fabricant | Description | Fiche Technique |
|---|---|---|---|---|
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Mimix Broadband |
GaAs MMIC Voltage Controlled Oscillator On-Chip Prescaler +5.0 dBm Output Power -35 dBc Harmonic Suppression -88 dBc/Hz @ 100KHz Phase Noise 110mA @ 4.0V Bias Supply 100% On-Wafer, DC and Output Power Testing 100% Visual Inspection to MIL-STD-883 Method 2010 Chip Device Layout XQ1006-BD |
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Mimix Broadband |
GaAs MMIC Voltage Controlled Oscillator On-Chip Resonator +4.5 dBm Output Power -97 dBc/Hz @ 100KHz Phase Noise 20mA @ -5.0V Bias Supply 100% On-Wafer, DC and Output Power Testing 100% Visual Inspection to MIL-STD-883 Method 2010 Chip Device Layout XQ1000-BD General Description Mimix Br |
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Mimix Broadband |
GaAs MMIC Voltage Controlled Oscillator On-Chip Resonator +5.0 dBm Output Power -97 dBc/Hz @ 100KHz Phase Noise 20mA @ -5.0V Bias Supply 100% On-Wafer, DC and Output Power Testing 100% Visual Inspection to MIL-STD-883 Method 2010 Chip Device Layout XQ1001-BD General Description Mimix Br |
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Mimix Broadband |
GaAs MMIC Voltage Controlled Oscillator On-Chip Resonator +5.0 dBm Output Power -97 dBc/Hz @ 100KHz Phase Noise 20mA @ -5.0V Bias Supply 100% On-Wafer, DC and Output Power Testing 100% Visual Inspection to MIL-STD-883 Method 2010 Chip Device Layout XQ1002-BD General Description Mimix Br |
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Mimix Broadband |
GaAs MMIC Voltage Controlled Oscillator On-Chip Resonator +4.5 dBm Output Power -97 dBc/Hz @ 100KHz Phase Noise 20mA @ -5.0V Bias Supply 100% On-Wafer, DC and Output Power Testing 100% Visual Inspection to MIL-STD-883 Method 2010 Chip Device Layout XQ1003-BD General Description Mimix Br |
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Mimix Broadband |
GaAs MMIC Voltage Controlled Oscillator On-Chip Resonator +5.0 dBm Output Power -97 dBc/Hz @ 100KHz Phase Noise 20mA @ -5.0V Bias Supply 100% On-Wafer, DC and Output Power Testing 100% Visual Inspection to MIL-STD-883 Method 2010 Chip Device Layout XQ1004-BD General Description Mimix Br |
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Mimix Broadband |
GaAs MMIC Voltage Controlled Oscillator On-Chip Prescaler +6.0 dBm Output Power -88 dBc/Hz @ 100KHz Phase Noise -40 dBc Harmonic Suppression 110mA @ 4.0V Bias Supply 100% On-Wafer, DC and Output Power Testing 100% Visual Inspection to MIL-STD-883 Method 2010 Chip Device Layout XQ1005-BD |
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