| No. | Partie # | Fabricant | Description | Fiche Technique |
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STMicroelectronics |
LIQUID LEVEL ALARM ake theL4620particularlyversatile for many applications and give the possibility to use various sensor types. Internal circuits prevent spurious indications from the liquid sensor and a latch keeps the alarm activateduntilthe supply voltageis switche |
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Microsemi |
500mW Metallurgically Bonded Glass Surface Mount Zener Diodes • Surface mount equivalent to JEDEC registered 1N4099 through 1N4135 and 1N4614 through 1N4627 series. • Internal metallurgical bond. • Max noise density 40 μV / √Hz for 6.8 V and up. Falls quickly to 1 μV / √Hz at lower voltages. • JAN, JANTX, JANTX |
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Microsemi |
METALLURGICALLY BONDED GLASS SURFACE MOUNT 0.5 WATT ZENERS • Surface mount equivalent to JEDEC |
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Motorola |
LOW NOISE LEVEL SILICON PASSIVATED ZENER DIODES nd readily solderable POLARITY: Cathode indicated by color band. When operated in the zener mode, cathode will be positive with respect to anode MOUNT1NG POSmON: Any 250 ~ 200 oz ~150 <>- ~ <:> 100 ~ ,p 50 o o POWER TEMPERATURE DERATING CURVE '" "" |
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MCC |
500mW Silicon Zener Diodes • Zener Voltage Range = 1.8V to 47V • Double Slug Type Construction • Metallurgical Bonded Construction • Lead Free Finish/Rohs Compliant (Note1) ("P"Suffix designates Compliant. See ordering information) • Moisture Sensitivity: Level 1 Mechanical Da |
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Microsemi |
GLASS SURFACE MOUNT 0.5 WATT ZENERS • Surface mount equivalent to JEDEC registered 1N4099 thru 1N4135 and 1N4614 thru 1N4627 series • Int |
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Central Semiconductor |
SURFACE MOUNT 500mW LOW NOISE SILICON ZENER DIODES |
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International Rectifier |
N-Channel HEXFET Power MOSFET mperature, for 10 seconds (1.6mm from case) c e °C Avalanche Characteristics EAS (Thermally limited) IAR EAR Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy c d c i 113 See Fig. 14, 15, 22a, 22b, mJ A mJ Thermal |
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INCHANGE |
N-Channel MOSFET ·With To-262(I2PAK) package ·Low input capacitance and gate charge ·Low gate input resistance ·100% avalanche tested ·Minimum Lot-to-Lot variations for robust device performance and reliable operation ·APPLICATIONS ·Switching applications ·ABSOLUTE |
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