No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
|
|
Intersil Corporation |
Radiation Hardened Octal Three-State Transparent Latch |
|
|
|
Intersil Corporation |
Radiation Hardened Octal Three-State Buffer/Line Driver • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96726 and Intersil’s QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . . . . . . |
|
|
|
Intersil Corporation |
Radiation Hardened TTL Input/ 3-to-8 Line Decoder/Demultiplexer • QML Qualified Per MIL-PRF-38535 Requirements • 1.25Micron Radiation Hardened SOS CMOS • Radiation Environment - Latch-up Free Under any Conditions - Total Dose . . . . . . . . . . . . . . . . . . . . . . 3 x 105 RAD(Si) - SEU Immunity . . . . . . . |
|
|
|
Intersil Corporation |
Radiation Hardened Octal Non-Inverting Bidirectional Bus Transceiver • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96719 and Intersil’ QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . . . . . . . |
|
|
|
Intersil Corporation |
Radiation Hardened Octal D Flip-Flop/ Three-State • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose 300K RAD (Si) • Single Event Upset (SEU) Immunity <1 x 10-10 Errors/Bit-Day (Typ) • SEU LET Threshold >80 MEV-cm2/mg • Dose Rate Upset >1011 RAD (Si)/s, 20ns Pulse • Latch-Up Free Under Any Condi |
|
|
|
Intersil Corporation |
16-Channel/ 8-Channel/ Differential 8-Channel and Differential 4-Channel/ CMOS Analog MUXs with Active Overvoltage Protection make the HI-506A, HI-507A, HI-508A and HI-509A ideal for use in systems where the analog inputs originate from external equipment, or separately powered circuitry. All devices are fabricated with 44V dielectrically isolated CMOS technology. The HI-50 |
|
|
|
Intersil Corporation |
Radiation Hardened Triple Three-Input NAND Gate • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose 300K RAD (Si) • Single Event Upset (SEU) Immunity <1 x 10-10 Errors/Bit-Day (Typ) • SEU LET Threshold >80 MEV-cm2/mg • Dose Rate Upset >1011 RAD (Si)/s, 20ns Pulse • Latch-Up Free Under Any Condi |
|
|
|
Intersil Corporation |
Radiation Hardened Single 8/Differential 4 Channel CMOS Analog Multiplexers with Active Overvoltage Protection make the HS-0548RH and HS-0549RH ideal for use in systems where the analog inputs originate from external equipment or separately powered circuitry. Both devices are fabricated with 44V dielectrically isolated CMOS technology. The HS-0548 is an 8 cha |
|
|
|
Intersil Corporation |
16-Channel/ 8-Channel/ Differential 8-Channel and Differential 4-Channel/ CMOS Analog MUXs with Active Overvoltage Protection make the HI-506A, HI-507A, HI-508A and HI-509A ideal for use in systems where the analog inputs originate from external equipment, or separately powered circuitry. All devices are fabricated with 44V dielectrically isolated CMOS technology. The HI-50 |
|
|
|
Intersil Corporation |
16-Channel/ 8-Channel/ Differential 8-Channel and Differential 4-Channel/ CMOS Analog MUXs with Active Overvoltage Protection make the HI-506A, HI-507A, HI-508A and HI-509A ideal for use in systems where the analog inputs originate from external equipment, or separately powered circuitry. All devices are fabricated with 44V dielectrically isolated CMOS technology. The HI-50 |
|
|
|
Intersil Corporation |
Radiation Hardened Quad 2-Input AND Gate • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose 300K RAD (Si) • Single Event Upset (SEU) Immunity <1 x 10-10 Errors/Bit-Day (Typ) • SEU LET Threshold >80 MEV-cm /mg • Dose Rate Upset >10 11 2 RAD (Si)/s, 20ns Pulse • Latch-Up Free Under Any |
|
|
|
Intersil Corporation |
Radiation Hardened Dual J-K Flip-Flop Pinouts • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96714 and Intersil’s QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . |
|
|
|
Intersil Corporation |
Radiation Hardened Quad Buffer/ Three-State • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96715 and Intersil’ QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . . . . . . . |
|
|
|
Intersil Corporation |
Radiation Hardened 4-Bit Synchronous Counter • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96716 and Intersil’s QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . . . . . . |
|
|
|
Intersil Corporation |
High Reliability/ Radiation Hardened Octal Buffer/Line Driver/ Three-State • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96717 and Intersil’s QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . . . . . . |
|
|
|
Intersil Corporation |
Radiation Hardened Octal Non-Inverting Bidirectional Bus Transceiver • QML Class T, Per MIL-PRF-38535 • Radiation Performance - Gamma Dose (γ) 1 x 105 RAD(Si) - Latch-Up Free Under Any Conditions - Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day (Typ) - SEU LET Threshold . . . . . . . . . . . . .>100 MEV- |
|
|
|
Intersil Corporation |
Radiation Hardened 9-Bit Odd/ Even Parity Generator Checker • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96720 and Intersil’ QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . . . . . . . |
|
|
|
Intersil Corporation |
Radiation Hardened Octal Transparent Latch/ Three-State • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose 300K RAD (Si) • Single Event Upset (SEU) Immunity <1 x 10-10 Errors/Bit-Day (Typ) • SEU LET Threshold >80 MEV-cm2/mg • Dose Rate Upset >1011 RAD (Si)/s, 20ns Pulse • Latch-Up Free Under Any Condi |
|
|
|
Intersil Corporation |
Radiation Hardened Octal Three-State Buffer/Line Driver • QML Class T, Per MIL-PRF-38535 • Radiation Performance - Gamma Dose (γ) 1 x 105 RAD(Si) - Latch-Up Free Under Any Conditions - Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day (Typ) - SEU LET Threshold . . . . . . . . . . . . .>100 MEV- |
|
|
|
Intersil Corporation |
Active Isolation Enhancer and Interference Canceller that utilize high data rates simultaneously, removing interference within wireless terminals like handsets has become a challenge. Reducing the Electromagnetic Interference recovers the receiver sensitivity, enabling simultaneous operation of multipl |
|