No. | Partie # | Fabricant | Description | Fiche Technique |
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IXYS |
XPT IGBT / Advantages: ● High level of integration - only one power semiconductor module required for the whole drive ● Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - low EMI - square RBS |
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IXYS |
IGBT • Easy paralleling due to the positive temperature coefficient of the on-state voltage • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - low EMI • Thin wafer technology |
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IXYS |
XPT IGBT / Advantages: ● Easy paralleling due to the positive temperature coefficient of the on-state voltage ● Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - low EMI - square RBSOA @ 3x |
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IXYS |
XPT IGBT • Easy paralleling due to the positive temperature coefficient of the on-state voltage • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - square RBSOA @ 3x IC - |
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IXYS |
XPT IGBT / Advantages: ● Easy paralleling due to the positive temperature coefficient of the on-state voltage ● Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - low EMI - square RBSOA @ 3x |
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IXYS |
XPT IGBT • Easy paralleling due to the positive temperature coefficient of the on-state voltage • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - square RBSOA @ 3x IC - low EM |
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IXYS |
X2PT IGBT / Advantages: • X2PT - 2nd generation Xtreme light Punch Through • Tvjm = 175°C • Easy paralleling due to the positive temperature coefficient of the on-state voltage • Rugged X2PT design results in: - short circuit rated for 10 µsec. - very low gate |
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IXYS |
XPT IGBT • Easy paralleling due to the positive temperature coefficient of the on-state voltage • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - square RBSOA @ 3x IC - low EMI • Thin waf |
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IXYS |
X2PT IGBT / Advantages: • X2PT - 2nd generation Xtreme light Punch Through • Tvjm = 175°C • Easy paralleling due to the positive temperature coefficient of the on-state voltage • Rugged X2PT design results in: - short circuit rated for 10 μsec. - very low gate |
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IXYS |
XPT IGBT / Advantages: • High level of integration - only one power semiconductor module required for the whole drive • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - low EMI - square RBS |
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IXYS |
X2PT IGBT / Advantages: • X2PT - 2nd generation Xtreme light Punch Through • Tvjm = 175°C • Easy paralleling due to the positive temperature coefficient of the on-state voltage • Rugged X2PT design results in: - short circuit rated for 10 μsec. - very low gate |
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IXYS |
XPT IGBT • Easy paralleling due to the positive temperature coefficient of the on-state voltage • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - square RBSOA @ 3x IC - lo |
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IXYS |
IGBT • Easy paralleling due to the positive temperature coefficient of the on-state voltage • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - low EMI • Thin wafer technology |
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IXYS |
IGBT • High level of integration - only one power semiconductor module required for the whole drive • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - square RBSOA @ 3x IC |
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IXYS |
XPT IGBT • Easy paralleling due to the positive temperature coefficient of the on-state voltage • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - square RBSOA @ 3x IC - |
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IXYS |
XPT IGBT • High level of integration • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - square RBSOA @ 3x IC - low EMI • Thin wafer technology combined with the XPT design results |
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IXYS |
IGBT • Easy paralleling due to the positive temperature coefficient of the on-state voltage • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - low EMI • Thin wafer technology |
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IXYS |
XPT IGBT • High level of integration • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - square RBSOA @ 3x IC - low EMI • Thin wafer technology combined with the XPT design results |
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IXYS |
XPT IGBT • Easy paralleling due to the positive temperature coefficient of the on-state voltage • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - square RBSOA @ 3x IC - |
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IXYS |
XPT IGBT • High level of integration • Rugged XPT design (Xtreme light Punch Through) results in: - short circuit rated for 10 µsec. - very low gate charge - square RBSOA @ 3x IC - low EMI • Thin wafer technology combined with the XPT design results |
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