logo

INCHANGE FKP DataSheet

No. Partie # Fabricant Description Fiche Technique
1
FKP252

INCHANGE
N-Channel MOSFET

·With TO-220F packaging
·High speed switching
·Low gate input resistance
·Standard level gate drive
·Easy to use
·100% avalanche tested
·Minimum Lot-to-Lot variations for robust device performance and reliable operation
·APPLICATIONS
·Power supply
·
Datasheet
2
FKP330C

INCHANGE
N-Channel MOSFET

·Drain Current
  –ID=30A@ TC=25℃
·Drain Source Voltage- : VDSS=330V(Min)
·Static Drain-Source On-Resistance : RDS(on) = 63mΩ(Max)
·100% avalanche tested
·Minimum Lot-to-Lot variations for robust device performance and reliable operation DESCRIPTION
·D
Datasheet
3
FKP253

INCHANGE
N-Channel MOSFET

·With TO-220F packaging
·High speed switching
·Low gate input resistance
·Standard level gate drive
·Easy to use
·100% avalanche tested
·Minimum Lot-to-Lot variations for robust device performance and reliable operation
·APPLICATIONS
·Power supply
·
Datasheet
4
FKP250A

INCHANGE
N-Channel MOSFET

·Drain Current
  –ID=50A@ TC=25℃
·Drain Source Voltage- : VDSS=250V(Min)
·Static Drain-Source On-Resistance : RDS(on) = 43mΩ(Max)
·100% avalanche tested
·Minimum Lot-to-Lot variations for robust device performance and reliable operation DESCRIPTION
·D
Datasheet
5
FKP300A

INCHANGE
N-Channel MOSFET

·Drain Current
  –ID=30A@ TC=25℃
·Drain Source Voltage- : VDSS=300V(Min)
·Static Drain-Source On-Resistance : RDS(on) = 65mΩ(Max)
·100% avalanche tested
·Minimum Lot-to-Lot variations for robust device performance and reliable operation DESCRIPTION
·D
Datasheet
6
FKP280A

INCHANGE
N-Channel MOSFET

·Drain Current
  –ID=40A@ TC=25℃
·Drain Source Voltage- : VDSS=280V(Min)
·Static Drain-Source On-Resistance : RDS(on) = 53mΩ(Max)
·100% avalanche tested
·Minimum Lot-to-Lot variations for robust device performance and reliable operation DESCRIPTION
·D
Datasheet
7
FKP202

INCHANGE
N-Channel MOSFET

·Drain Current
  –ID=45A@ TC=25℃
·Drain Source Voltage- : VDSS=200V(Min)
·Static Drain-Source On-Resistance : RDS(on) = 53mΩ(Max)
·100% avalanche tested
·Minimum Lot-to-Lot variations for robust device performance and reliable operation DESCRIPTION
·D
Datasheet



Depuis 2018 :: D4U Semiconductor :: (Politique de confidentialité et contact