| No. | Partie # | Fabricant | Description | Fiche Technique |
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Texas Instruments |
SCAN TEST DEVICE -mil Center-to-Center Spacings SN54ABT18502 . . . HV PACKAGE (TOP VIEW) 1A2 1A1 1OEAB GND 1LEAB 1CLKAB TDO VCC NC TMS 1CLKBA 1LEBA 1OEBA GND 1B1 1B2 1B3 1A3 1A4 1A5 GND 1A6 1A7 1A8 1A9 NC VCC 2A1 2A2 2A3 GND 2A4 2A5 2A6 9 8 7 6 5 4 3 2 1 68 67 66 |
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Texas Instruments |
SCAN TEST DEVICES ndom Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes D Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin |
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Texas Instruments |
Scalable 2-Phase Synchronous Buck Controller 1 •2 Wide Input Voltage Range of 4.5V to 18V • Up to 12 Channels for 300A Load • System Accuracy Better Than 1% • 0.6V to 3.6V Output Voltage Range • Switching Frequency From 200 kHz to 1 MHz • Phase Current Sharing ±12% Max Over Temperature • Integr |
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ETCTI |
Mobile I/O Comp Supp Keyscan I/O Expansion PWM ACCESS.bus Host I/F (Rev. A) |
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ETCTI |
LM8327 Mobile I/O Companion Supporting Keyscan I/O Expansion PWM ACCESS.bus (Rev. A) |
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ETCTI |
LM8328 Mobile I/O Companion Supporting Keyscan I/O Expansion PWM ACCESS.bus (Rev. A) |
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ETCTI |
High Temp 20-80MHz 10Bit Bus LVDS SerDes w/IEEE 1149.1 JTAG at-speed BIST (Rev. C) |
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Texas Instruments |
Cascaded PWM Controller 1 •2 Internal Start-up Bias Regulator • Programmable Line Under-Voltage Lockout (UVLO) with Adjustable Hysteresis • Current Mode Control • Internal Error Amplifier with Reference • Cycle-by-cycle Over-Current Protection • Leading Edge Blanking • Prog |
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ETCTI |
20-66MHz 10Bit Bus LVDS Serial Deserial w/IEEE 1149.1 (JTAG) at-speed BIST (Rev. D) |
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ETCTI |
SCANSTA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port (Rev. K) |
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ETCTI |
SCANSTA476 Eight Input IEEE 1149.1 Analog Voltage Monitor (Rev. G) |
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ETCTI |
SCAN15MB200 Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer w/Pre-Emphasis IEEE 1149.6 (Rev. E) |
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Texas Instruments |
SCAN TEST DEVICE 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. SN54ABT18245 . . . WD PACKAGE (TOP VIEW) 1DIR 1B1 1B2 GND 1B3 1 |
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Texas Instruments |
Mobile I/O Companion Supporting Key-Scan 1 •2 8 × 8 Standard Keys • 8 Special Function Keys (SF Keys) Providing a Total of 72 Keys for the Maximum Keyboard Matrix • ACCESS.Bus (I2C-compatible) Communication Interface to the Host • Four General Purpose Host Programmable I/O Pins with Two Opt |
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Texas Instruments |
Cascaded PWM Controller 1 • Internal Start-up Bias Regulator • Programmable Line Under-Voltage Lockout (UVLO) with Adjustable Hysteresis • Current Mode Control • Internal Error Amplifier with Reference • Cycle-by-cycle Over-Current Protection • Leading Edge Blanking • Progr |
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Texas Instruments |
Cascaded PWM Controller 1 •2 Internal Start-up Bias Regulator • Programmable Line Under-Voltage Lockout (UVLO) with Adjustable Hysteresis • Current Mode Control • Internal Error Amplifier with Reference • Dual Mode Over-Current Protection • Leading Edge Blanking • Programma |
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ETCTI |
Controlled Keypad Scan IC With Integrated ESD Protection (Rev. E) |
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ETCTI |
LM3754 Scalable 2-Phase Synchronous Buck Controller w/ FET (Rev. B) |
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ETCTI |
Mobile I/O Companion Support Keyscan I/O Expansion PWM ACCESS.bus Host I/F (Rev. A) |
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ETCTI |
30-80 MHz 10Bit Bus LVDS Serial/Deserial w/ IEEE 1149.1 (JTAG) at-speed BIST (Rev. C) |
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