No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
|
|
Clare Inc |
HIGH-ENERGY TRIGGERED SPARK GAPS s Tight self-breakdown voltage tolerance APPLICATIONS s s s s (±10%;TA & TB series) s Adjustable self-breakdown voltage (TG-221 to TG-226) s Rugged ceramic-metal construction s Refractory metal electrodes s Corrosion-resistant stainless steel exter |
|
|
|
Clare Inc |
HIGH-ENERGY TRIGGERED SPARK GAPS s Tight self-breakdown voltage tolerance APPLICATIONS s s s s (±10%;TA & TB series) s Adjustable self-breakdown voltage (TG-221 to TG-226) s Rugged ceramic-metal construction s Refractory metal electrodes s Corrosion-resistant stainless steel exter |
|
|
|
Clare Inc |
HIGH-ENERGY TRIGGERED SPARK GAPS s Tight self-breakdown voltage tolerance APPLICATIONS s s s s (±10%;TA & TB series) s Adjustable self-breakdown voltage (TG-221 to TG-226) s Rugged ceramic-metal construction s Refractory metal electrodes s Corrosion-resistant stainless steel exter |
|
|
|
Clare Inc |
HIGH-ENERGY TRIGGERED SPARK GAPS s Tight self-breakdown voltage tolerance APPLICATIONS s s s s (±10%;TA & TB series) s Adjustable self-breakdown voltage (TG-221 to TG-226) s Rugged ceramic-metal construction s Refractory metal electrodes s Corrosion-resistant stainless steel exter |
|
|
|
Clare Inc. |
HIGH-ENERGY TRIGGERED SPARK GAPS n Rugged ceramic-metal construction n -55°C to +125°C operating temperature n Short delay time n Compact size n High reliability n Vibration tested to MIL-STD-202D method 204, test conditions A n Thermal shock tested per MIL-STD-202D method 107, test |
|
|
|
Clare Inc |
HIGH-ENERGY TRIGGERED SPARK GAPS s Tight self-breakdown voltage tolerance APPLICATIONS s s s s (±10%;TA & TB series) s Adjustable self-breakdown voltage (TG-221 to TG-226) s Rugged ceramic-metal construction s Refractory metal electrodes s Corrosion-resistant stainless steel exter |
|
|
|
Clare |
HIGH-SPEED TRANSIENT SURGE PROTECTORS s Fast impulse breakdown (≤120% of typical DC APPLICATIONS s s s s s breakdown to 200kV/µs) s Tight DC breakdown voltage tolerance (± 10%) s Non-radioactive s Low capacitance Antenna feedlines Test equipment Video displays Medical electronics Inst |
|
|
|
Clare |
MICROWAVE NOISE TUBES & NOISE SOURCES s s s s s APPLICATIONS s Noise figure measurement Excess noise ratios (ENR): up to 20dB Broad bandwidth Excellent long term stability Life up to 20,000 hours AC, DC, or pulsed operation SPECIFICATION RANGES Parameter Frequency ENR Operating Curren |
|
|
|
Clare |
MICROWAVE NOISE TUBES & NOISE SOURCES s s s s s APPLICATIONS s Noise figure measurement Excess noise ratios (ENR): up to 20dB Broad bandwidth Excellent long term stability Life up to 20,000 hours AC, DC, or pulsed operation SPECIFICATION RANGES Parameter Frequency ENR Operating Curren |
|
|
|
Clare |
MICROWAVE NOISE TUBES & NOISE SOURCES s s s s s APPLICATIONS s Noise figure measurement Excess noise ratios (ENR): up to 20dB Broad bandwidth Excellent long term stability Life up to 20,000 hours AC, DC, or pulsed operation SPECIFICATION RANGES Parameter Frequency ENR Operating Curren |
|
|
|
Clare |
MICROWAVE NOISE TUBES & NOISE SOURCES s s s s s APPLICATIONS s Noise figure measurement Excess noise ratios (ENR): up to 20dB Broad bandwidth Excellent long term stability Life up to 20,000 hours AC, DC, or pulsed operation SPECIFICATION RANGES Parameter Frequency ENR Operating Curren |
|
|
|
Clare |
AC Power Switch • Load Current up to 1A (3A with heat sink) • Blocking Voltages up to 600V • 5mA Sensitivity • Zero-Crossing Detection • DC Control, AC Output • Optically Isolated • TTL and CMOS Compatible • Low EMI and RFI Generation • High Noise Immunity • VDE com |
|
|
|
Clare |
AC Power Switch • Load Current up to 1A (3A with heat sink) • Blocking Voltages up to 600V • 5mA Sensitivity • Zero-Crossing Detection • DC Control, AC Output • Optically Isolated • TTL and CMOS Compatible • Low EMI and RFI Generation • High Noise Immunity • VDE com |
|
|
|
Clare |
AC Power Switch • Load Current up to 1A (3A with heat sink) • Blocking Voltages up to 600V • 5mA Sensitivity • Zero-Crossing Detection • DC Control, AC Output • Optically Isolated • TTL and CMOS Compatible • Low EMI and RFI Generation • High Noise Immunity • VDE com |
|