| No. | Partie # | Fabricant | Description | Fiche Technique |
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AVAGO TECHNOLOGIES |
Optical Encoder Modules Reliability Data estimated MTBF and failure rate at temperatures lower than the actual stress temperature can be determined by using an Arrhenius model for temperature acceleration. Results of such calculations are shown in the table on the following page using an a |
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AVAGO TECHNOLOGIES |
Optical Encoder Modules Reliability Data estimated MTBF and failure rate at temperatures lower than the actual stress temperature can be determined by using an Arrhenius model for temperature acceleration. Results of such calculations are shown in the table on the following page using an a |
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AVAGO TECHNOLOGIES |
(HEDS-xx00) Optical Encoder Modules estimated MTBF and failure rate at temperatures lower than the actual stress temperature can be determined by using an Arrhenius model for temperature acceleration. Results of such calculations are shown in the table on the following page using an a |
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