| No. | Partie # | Fabricant | Description | Fiche Technique |
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National Semiconductor |
9-Bit Latchable Transceiver Y Y Y Y Y Y Y Y Y Latchable transceiver with output sink of 24 mA Option to select generate parity and check or ‘‘feedthrough’’ data parity in directions A-to-B or B-to-A Independent latch enable for A-to-B and B-to-A directions Select pin for OD |
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Texas Instruments |
SCAN-PATH LINKERS TMS1 8 DTMS2 9 DTMS3 10 DTMS4 11 DTCK 12 TDO 13 TMS 14 28 DCI 27 MCI 26 TRST 25 ID1 24 ID2 23 ID3 22 ID4 21 VCC 20 DTDI1 19 DTDI2 18 DTDI3 17 DTDI4 16 TDI 15 TCK SN54ACT8997 . . . FK PACKAGE (TOP VIEW) ID1 ID2 ID3 ID4 V CC DTDI1 DTDI2 description |
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Texas Instruments |
IEEE STD 1149.1 (JTAG) TAP MASTERS his family of components supports IEEE Standard 1149.1-1990 (JTAG) boundary scan to facilitate testing of complex circuit-board assemblies. The ’ACT8990 differ from other SCOPE™ integrated circuits. Their function is to control the JTAG serial-test b |
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