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NCS36000 Passive Infrared (PIR) Detector Controller The NCS36000 is a fully integrated mixed−signal CMOS device designed for low−cost passive infrared controlling applications. The device integrates two low−noise amplifiers and a LDO regulator to drive the sensor. The output of the amplifiers goes to a window comparator that uses internal voltage references.
• 3.0 − 5.75 V Operation
• −40 to 85°C
• 14 Pin SOIC Package
• Integrated 2−Stage Amplifier
• Internal LDO to Drive Sensor
• Internal Oscillator with External RC
• Single or Dual Pulse Detection
• Direct Drive of LED and OUT
• This is a Pb−Free Device
Typical Applications
• Automatic Lighting (Residential and Commercial)
• Automation of Doors
• Motion Triggered Events (Animal photography)
www.onsemi.com
MARKING DIAGRAM
14
1 SOIC−14 D SUFF.
| No. | Partie # | Fabricant | Description | Fiche Technique |
|---|---|---|---|---|
| 1 | NCS36510 |
ON Semiconductor |
Low Power System-on-Chip |
|
| 2 | NCS32100 |
ON Semiconductor |
Inductive Position Sensor |
|
| 3 | NCS325 |
ON Semiconductor |
Zero-Drift Operational Amplifier |
|
| 4 | NCS333 |
ON Semiconductor |
Zero-Drift Operational Amplifier |
|
| 5 | NCS333A |
ON Semiconductor |
Zero-Drift Operational Amplifier |
|
| 6 | NCS3402 |
ON Semiconductor |
Dual Nano-power Open Drain Output Comparator |
|
| 7 | NCS37000 |
ON Semiconductor |
Ground Fault Circuit Interrupter |
|
| 8 | NCS37005 |
ON Semiconductor |
Ground Fault Interrupter |
|
| 9 | NCS37010 |
ON Semiconductor |
Self Test With Lockout Ground Fault-Circuit Interrupter |
|
| 10 | NCS37012 |
ON Semiconductor |
Self Test Ground Fault-Circuit Interrupter |
|
| 11 | NCS37014 |
ON Semiconductor |
Self Test Ground Fault-Circuit Interrupter |
|
| 12 | NCS37015 |
ON Semiconductor |
Self Test Ground Fault-Circuit Interrupter |
|