in this document subject to change without notice. © Agilent Technologies, Inc. 2007, 2008 Printed in USA, May 23, 2008 5989-7300EN .
(patent pending) for the photoelectric frequency response of the entire system. Agilent RIN measurement system also reduces uncertainties by removing the interference by thermal noise and shot noise precisely. The measurement speed of N4371A RIN measurement system is very fast by special control of the spectrum analyzer. The measurement time is less than 5 seconds with the condition of a 20 GHz www.DataSheet4U.com frequency span, 2,000 frequency points and 10 times average. The high-speed measurement enables a real-time observation of RIN frequency characteristics with varying parameters of t.
No. | Partie # | Fabricant | Description | Fiche Technique |
---|---|---|---|---|
1 | N4373C |
Agilent(Hewlett-Packard) |
67 GHz Single-Mode Lightwave Component Analyzer | |
2 | N4374B |
Agilent(Hewlett-Packard) |
4.5 GHz Single-Mode Lightwave Component Analyzer | |
3 | N4375B |
Agilent(Hewlett-Packard) |
20 GHz and 26.5 GHz Single-Mode Lightwave Component Analyzer | |
4 | N4376B |
Agilent(Hewlett-Packard) |
20 GHz and 26.5 GHz Single-Mode Lightwave Component Analyzer | |
5 | N4316MK020 |
IXYS |
Phase Control Thyristor | |
6 | N4316MK040 |
IXYS |
Phase Control Thyristor | |
7 | N4316MK060 |
IXYS |
Phase Control Thyristor | |
8 | N4340TE180 |
IXYS |
Phase Control Thyristor | |
9 | N4340TE220 |
IXYS |
Phase Control Thyristor | |
10 | N4340TJ180 |
IXYS |
Phase Control Thyristor | |
11 | N4340TJ220 |
IXYS |
Phase Control Thyristor | |
12 | N435 |
ETC |
ISO/IEC JTC 1/SIC 2/WG 3 7-bit and 8-bit codes and their extension SECRETARIAT |