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K8P5516UZB - Samsung semiconductor

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K8P5516UZB 256Mb B-die NOR FLASH

of Hardwre Protection in Figure 8: Enhanced Block Protection/Unprotection is changed from"A outermost block on both ends of flash array locked" to "Highest or lowest block locked" DC Characteristics Table is revised. - "Read While Program Current"(I2) and "Read While Erase Current"(I3) are deleted. - "WP/ACC Input Leakage Current" is changed to "A9 Input Lea.

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...... 5 2.0 GENERAL DESCRIPTION .... 5 3.0 PIN DESCRIPTION . 6 4.0 56TSOP PIN CONFIGURATION ....

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