HEDS-6500 - AVAGO TECHNOLOGIES

HEDS-6500 Optical Encoder Modules Reliability Data

The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of MIL- STD-883. Avago tests parts at the absolute maximum rated conditions recommended for the device. The actual performance you obtain from Avago parts depends on the electrical and environmental characteristics of y.

Features

estimated MTBF and failure rate at temperatures lower than the actual stress temperature can be determined by using an Arrhenius model for temperature acceleration. Results of such calculations are shown in the table on the following page using an activation energy of 0.43 eV (reference MIL-HDBK-217). Table 1. Life Tests Demonstrated Performance Point Typical Performance Test Name High Temperature Operating Life Stress Test Conditions VCC = 5.5 V, VA = VB = 3.5 V TA = 100°C 1000 hours VCC = 5.5 V VA = VB = 3.5 V 1,000 hours TA = 85°C RH = 85% Total Device Hrs. 1,405,000 Units Tested 1,405 T.