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ESD8551 - ON Semiconductor

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ESD8551 ESD Protection Diode

of survivability specs. MARKING DIAGRAMS X2DFN2 CASE 714AB AM A = Specific Device Code M = Date Code X2DFNW2 CASE 711BG KM K = Specific Device Code M = Date Code PIN CONFIGURATION AND SCHEMATIC 1 2 = ORDERING INFORMATION See detailed ordering and shipping information on page 2 of this data sheet.  Semiconductor Components Industries, LLC, 2.

Features


 Low Capacitance (0.30 pF Max, I/O to GND)
 Protection for the Following IEC Standards: IEC 61000−4−2 (Level 4) & ISO 10605
 Low ESD Clamping Voltage
 SZESD8551MXWT5G − Wettable Flank Package for Optimal Automated Optical Inspection (AOI)
 SZ Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q101 Qualified and PPAP Capable
 These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant Typical Applications
 USB 3.0
 MHL 2.0
 eSATA MAXIMUM RATINGS (TJ = 25C unless otherwise noted) Rating Symbol Value Unit Operating J.

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