D78F0512 - NEC

D78F0512 UPD78F0512

User’s Manual 78K0/KC2 8-bit Single-Chip Microcontrollers μPD78F0511 μPD78F0511(A) μPD78F0512 μPD78F0512(A) μPD78F0513 μPD78F0513(A) μPD78F0514 μPD78F0514(A) μPD78F0515 μPD78F0515(A) μPD78F0513D μPD78F0515D μPD78F0511(A2) μPD78F0512(A2) μPD78F0513(A2) μPD78F0514(A2) μPD78F0515(A2) The μPD78F0513D and 78F0515D have on-chip debug functions. Do not use thes.

Features

between VIL (MAX) and VIH (MIN) due to noise, etc., the device may malfunction. Take care to prevent chattering noise from entering the device when the input level is fixed, and also in the transition period when the input level passes through the area between VIL (MAX) and VIH (MIN). 2 HANDLING OF UNUSED INPUT PINS Unconnected CMOS device inputs can be cause of malfunction. If an input pin is unconnected, it is possible that an internal input level may be generated due to noise, etc., causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels of CMOS devic.