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SCANSTA111 |
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| Part Number | SCANSTA111 |
| Manufacturer | National Semiconductor |
| Description | The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ab... |
| Features |
n True IEEE 1149.1 hierarchical and multidrop addressable capability n The 7 slot inputs support up to 121 unique addresses, an Interrogation Address, Broadcast Address, and 4 Multi-cast Group Addresses (address 000000 is reserved)
Connection Diagrams
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© 2004 National Semiconductor Corporation
DS101245
www.national.com
SCANSTA111
TABLE 1. Glossary LFSR LSP Local Linear Feedback Shift Register. When enabled, will generate a 16-bit signature of sampled serial test data. Local Scan Port. A four signal port that drives a local (i.e. non-backplane) scan chain. (e.g., TCK0, ... |
| Document |
 SCANSTA111 Data Sheet
PDF 524.14KB |
| Distributor | Stock | Price | Buy |
|---|
| No. | Parte # | Fabricante | Descripción | Hoja de Datos |
|---|---|---|---|---|
| 1 | SCANSTA111 |
ETCTI |
SCANSTA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port (Rev. K) |
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| 2 | SCANSTA112 |
National Semiconductor |
7-port Multidrop IEEE 1149.1 (JTAG) Multiplexer |
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| 3 | SCANSTA112 |
ETCTI |
SCANSTA112 7-Port Multidrop IEEE 1149.1 (JTAG) Multiplexer (Rev. I) |
|
| 4 | SCANSTA101 |
National Semiconductor |
Low Voltage IEEE 1149.1 STA Master |
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| 5 | SCANSTA101 |
ETCTI |
SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master (Rev. J) |
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