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DS21Q58 |
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| Part Number | DS21Q58 |
| Manufacturer | Maxim Integrated (https://www.analog.com/) Products |
| Description | A description of this device can be found in the product data sheet. You can find the product data sheet at http://dbserv.maxim-ic.com/l_datasheet3.cfm. Reliability Derating: The Arrhenius model will... |
| Features |
will be used to determine the acceleration factor for failure mechanisms that are temperature accelerated. AfT = exp((Ea/k)*(1/Tu - 1/Ts)) = tu/ts AfT = Acceleration factor due to Temperature tu = Time at use temperature (e.g. 55°C) ts = Time at stress temperature (e.g. 125°C) k = Boltzmann’s Constant (8.617 x 10-5 eV/°K) Tu = Temperature at Use (°K) Ts = Temperature at Stress (°K) Ea = Activation Energy (e.g. 0.7 ev) The activation energy of the failure mechanism is derived from either internal studies or industry accepted standards, or activation energy of 0.7ev will be used whenever actual ... |
| Document |
 DS21Q58 Data Sheet
PDF 17.45KB |
| Distributor | Stock | Price | Buy |
|---|
| No. | Parte # | Fabricante | Descripción | Hoja de Datos |
|---|---|---|---|---|
| 1 | DS21Q50 |
Maxim Integrated Products |
Quad E1 Transceiver |
|
| 2 | DS21Q552 |
Dallas Semiconducotr |
Quad T1/E1 Transceiver 5V |
|
| 3 | DS21Q554 |
Dallas Semiconducotr |
Quad T1/E1 Transceiver 5V |
|
| 4 | DS21Q59 |
Maxim Integrated Products |
RELIABILITY REPORT FOR DS21Q59/ REV A2 |
|
| 5 | DS21Q348 |
Maxim Integrated |
3.3V E1/T1/J1 Line Interface |
|