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NL17SHT04 डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - Inverting Buffer / CMOS Logic Level Shifter - ON Semiconductor

भाग संख्या NL17SHT04
समारोह Inverting Buffer / CMOS Logic Level Shifter
मैन्युफैक्चरर्स ON Semiconductor 
लोगो ON Semiconductor लोगो 
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NL17SHT04 pdf
NL17SHT04
MAXIMUM RATINGS
Symbol
Characteristics
Value
Unit
VCC
VIN
VOUT
DC Supply Voltage
DC Input Voltage
DC Output Voltage
High or LoVwCSCt=ate0
0.5 to +7.0
0.5 to +7.0
0.5 to 7.0
0.5 to VCC + 0.5
V
V
V
IIK Input Diode Current
20 mA
IOK Output Diode Current
VOUT < GND; VOUT > VCC
±20
mA
IOUT DC Output Current
±25 mA
ICC DC Supply Current, VCC and GND
50 mA
PD Power dissipation in still air
50 mW
TL Lead temperature, 1 mm from case for 10 s
260 °C
TJ Junction temperature under bias
+150
°C
Tstg Storage temperature
65 to +150
°C
ILatchup Latchup Performance
Above VCC and Below GND at 125°C (Note 1)
±100
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Tested to EIA/JESD78
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
VCC
VIN
VOUT
DC Supply Voltage
DC Input Voltage
DC Output Voltage
TA Operating Temperature Range
tr , tf Input Rise and Fall Time
VCC = 0
High or Low State
VCC = 3.3 V ± 0.3 V
VCC = 5.0 V ± 0.5 V
Min
3.0
0.0
0.0
0.0
55
0
0
Max
5.5
5.5
5.5
VCC
+125
100
20
Unit
V
V
V
°C
ns/V
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
Junction
Temperature °C
Time, Hours
Time, Years
80
1,032,200
117.8
90
419,300
47.9
100 178,700 20.4
110 79,600
9.4
120 37,000
4.2
130 17,800
2.0
140 8,900
1.0
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
1
1 10
100 1000
TIME, YEARS
Figure 3. Failure Rate vs. Time Junction Temperature
http://onsemi.com
2

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