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NL17SH32 डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - Single 2-Input OR Gate - ON Semiconductor

भाग संख्या NL17SH32
समारोह Single 2-Input OR Gate
मैन्युफैक्चरर्स ON Semiconductor 
लोगो ON Semiconductor लोगो 
पूर्व दर्शन
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<?=NL17SH32?> डेटा पत्रक पीडीएफ

NL17SH32 pdf
NL17SH32
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC
TSTG
TL
TJ
PD
MSL
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Sink Current
DC Supply Current per Supply Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Power Dissipation in Still Air
Moisture Sensitivity
−0.5 to +7.0
−0.5 to +7.0
−0.5 to VCC +0.5
−20
±20
±25
50
−65 to +150
260
+150
50
Level 1
V
V
V
mA
mA
mA
mA
°C
°C
°C
mW
FR Flammability Rating
Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in
ILATCHUP Latchup Performance
Above VCC and Below GND at 125°C (Note 1)
±100
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
VCC
VIN
VOUT
TA
tr , tf
DC Supply Voltage
DC Input Voltage
DC Output Voltage
Operating Temperature Range
Input Rise and Fall Time
Device Junction Temperature versus
Time to 0.1% Bond Failures
Junction
Temperature °C
Time, Hours
80 1,032,200
90 419,300
100 178,700
110 79,600
120 37,000
130 17,800
140 8,900
Time, Years
117.8
47.9
20.4
9.4
4.2
2.0
1.0
VCC = 3.3 V ± 0.3 V
VCC = 5.0 V ± 0.5 V
Min
2.0
0.0
0.0
−55
0
0
Max
5.5
5.5
VCC
+125
100
20
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
Unit
V
V
V
°C
ns/V
1
1 10
100 1000
TIME, YEARS
Figure 3. Failure Rate vs. Time
Junction Temperature
http://onsemi.com
2

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डाउनलोड[ NL17SH32 Datasheet.PDF ]


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