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NL17SH17 डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - Single Schmitt-Trigger Buffer - ON Semiconductor

भाग संख्या NL17SH17
समारोह Single Schmitt-Trigger Buffer
मैन्युफैक्चरर्स ON Semiconductor 
लोगो ON Semiconductor लोगो 
पूर्व दर्शन
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<?=NL17SH17?> डेटा पत्रक पीडीएफ

NL17SH17 pdf
NL17SH17
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC
IGND
TSTG
TL
TJ
MSL
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Source/Sink Current
DC Supply Current per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Moisture Sensitivity
VIN < GND
VOUT < GND, VOUT > VCC
0.5 to +7.0
0.5 to +7.0
0.5 to VCC + 0.5
20
±20
±12.5
±25
±25
65 to +150
260
+150
Level 1
V
V
V
mA
mA
mA
mA
mA
°C
°C
°C
FR
VESD
Flammability Rating
ESD Withstand Voltage
Oxygen Index: 28 to 34
Human Body Model (Note 2)
Machine Model (Note 3)
Charged Device Model (Note 4)
UL 94 V0 @ 0.125 in
>3000
>200
N/A
V
ILATCHUP Latchup Performance
Above VCC and Below GND at 125°C (Note 5)
±100
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Measured with minimum pad spacing on an FR4 board, using 10 mmby1 inch, 2ounce copper trace with no air flow.
2. Tested to EIA/JESD22A114A.
3. Tested to EIA/JESD22A115A.
4. Tested to JESD22C101A.
5. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
VCC
VIN
VOUT
TA
Dt / DV
Positive DC Supply Voltage
Digital Input Voltage
Output Voltage
Operating Temperature Range
Input Transition Rise or Fail Rate
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
Junction
Temperature °C
80
90
100
110
120
130
140
Time, Hours
1,032,200
419,300
178,700
79,600
37,000
17,800
8,900
Time, Years
117.8
47.9
20.4
9.4
4.2
2.0
1.0
VVCCCC
=
=
3.3
5.0
V
V
±
±
0.3
0.5
V
V
Min
1.65
0.0
0.0
55
0
0
Max
5.5
5.5
VCC
+125
No Limit
No Limit
Unit
V
V
V
°C
ns/V
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
1
1 10
100 1000
TIME, YEARS
Figure 3. Failure Rate vs. Time Junction Temperature
http://onsemi.com
2

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