DataSheet.in

NL17SH00P5T5G डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - Single 2-Input NAND Gate - ON Semiconductor

भाग संख्या NL17SH00P5T5G
समारोह Single 2-Input NAND Gate
मैन्युफैक्चरर्स ON Semiconductor 
लोगो ON Semiconductor लोगो 
पूर्व दर्शन
1 Page
		
<?=NL17SH00P5T5G?> डेटा पत्रक पीडीएफ

NL17SH00P5T5G pdf
NL17SH00
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC
TSTG
TL
TJ
PD
MSL
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Current
DC Supply Current per Supply Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Power Dissipation in Still Air
Moisture Sensitivity
0.5 to +7.0
0.5 to +7.0
0.5 to VCC +0.5
20
±20
±25
50
65 to +150
260
+150
50
Level 1
V
V
V
mA
mA
mA
mA
°C
°C
°C
mW
FR Flammability Rating
Oxygen Index: 28 to 34 UL 94 V0 @ 0.125 in
ILATCHUP Latchup Performance
Above VCC and Below GND at 125°C (Note 1)
±100
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
VCC DC Supply Voltage
VIN DC Input Voltage
VOUT
DC Output Voltage
TA Operating Temperature Range
tr , tf Input Rise and Fall Time
VVCCCC
=
=
3.3
5.0
V
V
±
±
0.3
0.5
V
V
Min
2.0
0.0
0.0
55
0
0
Max
5.5
5.5
VCC
+125
100
20
Unit
V
V
V
°C
ns/V
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
Junction
Temperature °C
80
90
100
110
120
130
140
Time, Hours
1,032,200
419,300
178,700
79,600
37,000
17,800
8,900
Time, Years
117.8
47.9
20.4
9.4
4.2
2.0
1.0
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
1
1 10
100 1000
TIME, YEARS
Figure 3. Failure Rate vs. Time Junction Temperature
http://onsemi.com
2

विन्यास 5 पेज
डाउनलोड[ NL17SH00P5T5G Datasheet.PDF ]


शेयर लिंक


अनुशंसा डेटापत्रक

भाग संख्याविवरणविनिर्माण
NL17SH00P5T5GSingle 2-Input NAND GateON Semiconductor
ON Semiconductor


भाग संख्याविवरणविनिर्माण
30L120CTSchottky RectifierPFC Device
PFC Device
AT28C010-12DKSpace 1-MBit (128K x 8) Paged Parallel EEPROMATMEL
ATMEL
B20NM50FDN-CHANNEL POWER MOSFETSTMicroelectronics
STMicroelectronics
D8442SD844SavantIC
SavantIC
FAE391-A20AM/FM Automotive Electronic TunerMitsumi
Mitsumi


Index : 0  1  2  3  4  5  6  7  8  9  A  B  C  D  E  F  G  H  I  J  K  L  M  N  O  P  Q  R  S  T  U  V  W  X  Y  Z



www.DataSheet.in    |   2017   |  संपर्क   |   खोज     |   English