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NL17SZ06 डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - Single Inverter - ON Semiconductor

भाग संख्या NL17SZ06
समारोह Single Inverter
मैन्युफैक्चरर्स ON Semiconductor 
लोगो ON Semiconductor लोगो 
पूर्व दर्शन
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<?=NL17SZ06?> डेटा पत्रक पीडीएफ

NL17SZ06 pdf
NL17SZ06
MAXIMUM RATINGS
Symbol
Characteristics
Value
Unit
VCC
VI
VO
IIK
IOK
IO
ICC
IGND
TSTG
PD
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Sink Current
DC Supply Current Per Supply Pin
DC Ground Current Per Ground Pin
Storage Temperature Range
Power Dissipation in Still Air
Output in Z or LOW State (Note 1)
VI < GND
VO < GND
SOT−353
SOT−553
−0.5 to +7.0
−0.5 VI +7.0
−0.5 VO 7.0
−50
−50
±50
±100
±100
−65 to +150
186
135
V
V
V
mA
mA
mA
mA
mA
°C
mW
qJA Thermal Resistance
SOT−353
SOT−553
350
496
°C/W
TL
TJ
ILatch−Up
MSL
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Latchup Performance
Moisture Sensitivity
Above VCC and Below GND at 85°C (Note 5)
260
+150
±100
Level 1
°C
°C
mA
FR
ESD
Flammability Rating
ESD Classification
Oxygen Index: 28 to 34
Human Body Model (Note 3)
Machine Model (Note 4)
Charged Device Model (Note 5)
UL 94 V−0 @ 0.125 in
2000
200
N/A
V
V
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. IO absolute maximum rating must be observed.
2. Tested to EIA/JESD22−A114−A, rated to EIA/JESD22−A114−B.
3. Tested to EIA/JESD22−A115−A, rated to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min Max Unit
VCC Supply Voltage
Operating
Data Retention Only
1.65
1.5
5.5 V
5.5
VI Input Voltage
0 5.5 V
VO Output Voltage
(Z or LOW State)
0
5.5 V
TA Operating Free−Air Temperature
−55
+125
°C
Dt/DV Input Transition Rise or Fall Rate
VCC = 2.5 V ±0.2 V
VCC = 3.0 V ±0.3 V
VCC = 5.0 V ±0.5 V
0
0
0
20 ns/V
10
5
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
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डाउनलोड[ NL17SZ06 Datasheet.PDF ]


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