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NL17SZ126 डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - Non-Inverting 3-State Buffer - ON Semiconductor

भाग संख्या NL17SZ126
समारोह Non-Inverting 3-State Buffer
मैन्युफैक्चरर्स ON Semiconductor 
लोगो ON Semiconductor लोगो 
पूर्व दर्शन
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<?=NL17SZ126?> डेटा पत्रक पीडीएफ

NL17SZ126 pdf
PIN ASSIGNMENT
(SOT−353/SC−88A/SOT−553/UDFN)
Pin Function
1 OE
2 IN A
3 GND
4 OUT Y
5 VCC
NL17SZ126
PIN ASSIGNMENT (SOT−953)
Pin Function
1 IN A
2 GND
3 OE
4 OUT Y
5 VCC
FUNCTION TABLE
Input
OE A
HL
HH
LX
X = Don’t Care
Output
Y
L
H
Z
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
VIN
VOUT
VOUT
DC Supply Voltage
DC Input Voltage
DC Output Voltage (SOT−353/SC−88A/SOT−553 Packages)
DC Output Voltage
(SOT−953 Package)
Output at High or Low State
Power−Down Mode (VCC = 0 V)
−0.5 to )7.0
−0.5 to )7.0
−0.5 to VCC +0.5
−0.5 to VCC +0.5
−0.5 to +0.5
V
V
V
V
IIK DC Input Diode Current
IOK DC Output Diode Current
(SOT−353/SC−88A/SOT−553 Packages)
VOUT < GND, VOUT > VCC
−50
±50
mA
mA
IOK
IOUT
ICC
TSTG
TL
TJ
qJA
PD
MSL
DC Output Diode Current (SOT−953 Package)
DC Output Sink Current
DC Supply Current per Supply Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Thermal Resistance (Note 1)
Power Dissipation in Still Air at 85°C
Moisture Sensitivity
VOUT < GND
SC−70/SC−88A
SC−70/SC−88A
−50
±50
±100
−65 to +150
260
+150
350
150
Level 1
mA
mA
mA
°C
°C
°C
°C/W
mW
FR
VESD
Flammability Rating
ESD Withstand Voltage
Oxygen Index: 28 to 34
Human Body Model (Note 2)
Machine Model (Note 3)
Charged Device Model (Note 4)
UL 94 V−0 @ 0.125 in
u2000
u200
N/A
V
ILATCHUP Latchup Performance Above VCC and Below GND at 125°C (Note 5)
±100
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2 ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Tested to EIA/JESD78.
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भाग संख्याविवरणविनिर्माण
NL17SZ125Non-Inverting 3-State BufferON Semiconductor
ON Semiconductor
NL17SZ126Non-Inverting 3-State BufferON Semiconductor
ON Semiconductor


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