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UT54ACT132 डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - Radiation-Hardened Quadruple 2-Input NAND Schmitt Triggers - Aeroflex Microelectronic Solutions

भाग संख्या UT54ACT132
समारोह Radiation-Hardened Quadruple 2-Input NAND Schmitt Triggers
मैन्युफैक्चरर्स Aeroflex Microelectronic Solutions 
लोगो Aeroflex Microelectronic Solutions लोगो 
पूर्व दर्शन
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<?=UT54ACT132?> डेटा पत्रक पीडीएफ

UT54ACT132 pdf
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UT54ACS132/UT54ACTS132
RADIATION HARDNESS SPECIFICATIONS 1
PARAMETER
Total Dose
SEU Threshold 2
SEL Threshold
Neutron Fluence
LIMIT
1.0E6
80
120
1.0E14
UNITS
rads(Si)
MeV-cm2/mg
MeV-cm2/mg
n/cm2
Notes:
1. Logic will not latchup during radiation exposure within the limits defined in the table.
2. Device storage elements are immune to SEU affects.
ABSOLUTE MAXIMUM RATINGS
SYMBOL
PARAMETER
LIMIT
UNITS
VDD
VI/O
TSTG
TJ
Supply voltage
Voltage any pin
Storage Temperature range
Maximum junction temperature
-0.3 to 7.0
-.3 to VDD +.3
-65 to +150
+175
V
V
C
C
et4U.com
TLS
JC
II
PD
Lead temperature (soldering 5 seconds)
Thermal resistance junction to case
DC input cDuraretanSt heet4U.com
Maximum power dissipation
+300
20
10
1
C
C/W DataShee
mA
W
Note:
1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device
at these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
SYMBOL
VDD
VIN
TC
PARAMETER
Supply voltage
Input voltage any pin
Temperature range
LIMIT
4.5 to 5.5
0 to VDD
-55 to + 125
UNITS
V
V
C
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भाग संख्याविवरणविनिर्माण
UT54ACT132Radiation-Hardened Quadruple 2-Input NAND Schmitt TriggersAeroflex Microelectronic Solutions
Aeroflex Microelectronic Solutions


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