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06033C333xxx डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - X7R Dielectric - AVX Corporation

भाग संख्या 06033C333xxx
समारोह X7R Dielectric
मैन्युफैक्चरर्स AVX Corporation 
लोगो AVX Corporation लोगो 
पूर्व दर्शन
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<?=06033C333xxx?> डेटा पत्रक पीडीएफ

06033C333xxx pdf
X7R Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Dissipation Factor
Insulation Resistance
Dielectric Strength
Resistance to
Flexure
Stresses
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Solderability
Resistance to
Solder Heat
Thermal
Shock
Load Life
Load
Humidity
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
X7R Specification Limits
-55ºC to +125ºC
Within specified tolerance
2.5% for 50V DC rating
3.0% for 25V DC rating
3.5% for 16V DC rating
5.0% for 10V DC rating
100,000Mor 1000M- µF,
whichever is less
No breakdown or visual defects
No defects
±12%
Meets Initial Values (As Above)
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
For Cap > 10 µF, 0.5Vrms @ 120Hz
Charge device with rated voltage for
60 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Deflection: 2mm
Test Time: 30 seconds
1mm/sec
Initial Value x 0.3
95% of each terminal should be covered
with fresh solder
No defects, <25% leaching of either end terminal
±7.5%
Meets Initial Values (As Above)
Meets Initial Values (As Above)
90 mm
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
Dip device in eutectic solder at 260ºC for 60
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Meets Initial Values (As Above)
No visual defects
±7.5%
Step 1: -55ºC ± 2º
Step 2: Room Temp
30 ± 3 minutes
3 minutes
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
±12.5%
Initial Value x 2.0 (See Above)
Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
No visual defects
±12.5%
Initial Value x 2.0 (See Above)
Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Step 3: +125ºC ± 2º 30 ± 3 minutes
Step 4: Room Temp 3 minutes
Repeat for 5 cycles and measure after
24 ± 2 hours at room temperature
Charge device with twice rated voltage in
test chamber set at 125ºC ± 2ºC
for 1000 hours (+48, -0)
Remove from test chamber and stabilize
at room temperature for 24 ± 2 hours
before measuring.
Store in a test chamber set at 85ºC ± 2ºC/
85% ± 5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at
room temperature and humidity for
24 ± 2 hours before measuring.
12

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अनुशंसा डेटापत्रक

भाग संख्याविवरणविनिर्माण
06033C333xxxX7R DielectricAVX Corporation
AVX Corporation


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