DataSheet.in

ADG836 डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - 0.5CMOS 1.65 V TO 3.6 V Dual SPDT/2:1 MUX - Analog Devices

भाग संख्या ADG836
समारोह 0.5CMOS 1.65 V TO 3.6 V Dual SPDT/2:1 MUX
मैन्युफैक्चरर्स Analog Devices 
लोगो Analog Devices लोगो 
पूर्व दर्शन
1 Page
		
<?=ADG836?> डेटा पत्रक पीडीएफ

ADG836 pdf
ADG836–SPECIFICATIONS1
(VDD = 2.7 V to 3.6 V, GND = 0 V, unless otherwise noted.)
Parameter
ANALOG SWITCH
Analog Signal Range
On Resistance (RON)
On Resistance Match between
Channels (RON)
On Resistance Flatness (RFLAT (ON))
LEAKAGE CURRENTS
Source Off Leakage IS (OFF)
Channel On Leakage ID, IS (ON)
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current
IINL or IINH
CIN, Digital Input Capacitance
DYNAMIC CHARACTERISTICS2
tON
tOFF
Break-before-Make Time Delay (tBBM)
Charge Injection
Off Isolation
Channel-to-Channel Crosstalk
–40C –40C
+25C to +85C to +125C
0.5
0.65 0.75
0.04
0.075
0.1
0.15
0 V to VDD
0.8
0.08
0.16
±0.2
±1 ±10
±0.2
±1 ±15
±100
±120
0.005
4
2
0.8
±0.1
21
26 28
4
78
17
40
–67
–90
29
9
5
–67
Total Harmonic Distortion (THD + N) 0.02
Insertion Loss
–3 dB Bandwidth
CS (OFF)
CD, CS (ON)
POWER REQUIREMENTS
IDD
–0.05
57
25
75
0.003
NOTES
1Temperature range is as follows: Y version: –40°C to +125°C.
2Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
1
4
Unit
Test Conditions/Comments
V
typ
max
typ
max
typ
max
nA typ
nA max
nA typ
nA max
VDD = 2.7 V
VDD = 2.7 V, VS = 0 V to VDD, IS = 10 mA;
Test Circuit 1
VDD = 2.7 V, VS = 0.65 V, IS = 10 mA
VDD = 2.7 V, VS = 0 V to VDD,
IS = 10 mA
VDD = 3.6 V
VS = 0.6 V/3.3 V, VD = 3.3 V/0.6 V;
Test Circuit 2
VS = VD = 0.6 V or 3.3 V; Test Circuit 3
V min
V max
µA typ
µA max
pF typ
VIN = VINL or VINH
ns typ
ns max
ns typ
ns max
ns typ
ns min
pC typ
dB typ
dB typ
dB typ
%
dB typ
MHz typ
pF typ
pF typ
µA typ
µA max
RL = 50 , CL = 35 pF
VS = 1.5 V/0 V; Test Circuit 4
RL = 50 , CL = 35 pF
VS = 1.5 V; Test Circuit 4
RL = 50 , CL = 35 pF
VS1 = VS2 = 1.5 V; Test Circuit 5
VS = 1.5 V, RS = 0 , CL = 1 nF;
Test Circuit 6
RL = 50 , CL = 5 pF, f = 100 kHz;
Test Circuit 7
S1A–S2A/S1B–S2B;
RL = 50 , CL = 5 pF, f = 100 kHz;
Test Circuit 10
S1A–S1B/S2A–S2B;
RL = 50 , CL = 5 pF, f = 100 kHz;
Test Circuit 9
RL = 32 , f = 20 Hz to 20 kHz,
VS = 2 V p-p
RL = 50 , CL = 5 pF; Test Circuit 8
RL = 50 , CL = 5 pF; Test Circuit 8
VDD = 3.6 V
Digital Inputs = 0 V or 3.6 V
–2– REV. 0

विन्यास 12 पेज
डाउनलोड[ ADG836 Datasheet.PDF ]


शेयर लिंक


अनुशंसा डेटापत्रक

भाग संख्याविवरणविनिर्माण
ADG8360.5CMOS 1.65 V TO 3.6 V Dual SPDT/2:1 MUXAnalog Devices
Analog Devices
ADG836L0.5 OHM CMOS 1.65 V to 3.6 V Dual SPDT/2:1 MUXAnalog Devices
Analog Devices


भाग संख्याविवरणविनिर्माण
30L120CTSchottky RectifierPFC Device
PFC Device
AT28C010-12DKSpace 1-MBit (128K x 8) Paged Parallel EEPROMATMEL
ATMEL
B20NM50FDN-CHANNEL POWER MOSFETSTMicroelectronics
STMicroelectronics
D8442SD844SavantIC
SavantIC
FAE391-A20AM/FM Automotive Electronic TunerMitsumi
Mitsumi


Index : 0  1  2  3  4  5  6  7  8  9  A  B  C  D  E  F  G  H  I  J  K  L  M  N  O  P  Q  R  S  T  U  V  W  X  Y  Z



www.DataSheet.in    |   2017   |  संपर्क   |   खोज     |   English